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Conference Proceedings

1. Optimization and Realization of Sub 100nm Channel Length Lateral Asymmetric Channel P-MOSFETS

Hemkar,M. ; Vasi,J. ; Rao,V.Ramgopal ; Cheng,B. ; Woo,J.C.S.

Pub. info.:	Proceedings of the Tenth International Workshop on the Physics of Semiconductor Devices (December 14-18, 1999). Part1 pp.584-587, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3975

Conference Proceedings

2. In-situ annealing during the growth of relaxed SiGe

Li,D. ; Huang,C. ; Cheng,B. ; Wang,H. ; Yu,Z. ; Zhang,C. ; Yu,J. ; Wang,Q.

Pub. info.:	Optical and infrared thin films : 1 August 2000, San Diego, USA. pp.93-99, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4094

Conference Proceedings

3. Si-based resonant-cavity-enhanced photodetector

Wang,Q. ; Li,C. ; Cheng,B. ; Yang,Q.

Pub. info.:	Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.107-111, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4225

Conference Proceedings

4. Approach to query-by-texture in image database systems

Zhang,A. ; Cheng,B. ; Acharya,R.S.

Pub. info.:	Digital image storage and archiving systems : 25-26 October 1995, Philadelphia, Pennsylvania. pp.338-349, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2606

Conference Proceedings

5. Microelectrophoresis devices with intergrated fluorescence detectors for high-througputDNA sequencing

Soper,S.A. ; Ford,S. ; Davies,J. ; Williams,D.C. ; Cheng,B. ; Klopf,M. ; Calderon,G. ; Saile,V.

Pub. info.:	Ultrasensitive Biochemical Diagnostics II. PartA pp.36-46, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2985

Conference Proceedings

6. Comparison of wavelet transforms and fractal coding in texture-based image retrieval

Zhang,A. ; Cheng,B. ; Acharya,R.S. ; Menon,R.P.

Pub. info.:	Visual Data Exploration and Analysis III. pp.116-125, 1996. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2656

Conference Proceedings

7. GaP/Si heterostructures grown by GS-MBE

Yu,J. ; Cheng,B. ; Yu,Z. ; Wang,Q.

Pub. info.:	Integrated Optoelectronics II. pp.9-12, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3551

Conference Proceedings

8. Preparation and photoluminescence of nc-Si/SiO2 MQW

Cheng,B. ; Yu,J. ; Yu,Z. ; Lei,Z. ; Li,D. ; Wang,Q.

Pub. info.:	Integrated Optoelectronics II. pp.13-17, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3551

Conference Proceedings

9. SPER and characteristics of Si1-yCy alloys

Yu,Z. ; Yu,J. ; Cheng,B. ; Lei,Z. ; Li,D. ; Wang,Q. ; Liang,J.

Pub. info.:	Integrated Optoelectronics II. pp.18-22, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3551

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Conference Proceedings

10. Normal-incident SiGe/Si MQW photodetectors operating at 1.3ｦﾌm

Cheng,B. ; Li,C. ; Yang,Q. ; Wang,H. ; Luo,L. ; Yu,J. ; Wang,Q.

Pub. info.:	Photonics Technology into the 21st Century: Semiconductors, Microstructures, and Nanostructures. pp.326-329, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3899

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