1.

Conference Proceedings
Conference Proceedings
1. In-situ annealing during the growth of relaxed SiGe
Li,D. ; Huang,C. ; Cheng,B. ; Wang,H. ; Yu,Z. ; Zhang,C. ; Yu,J. ; Wang,Q.
Pub. info.: Optical and infrared thin films : 1 August 2000, San Diego, USA.  pp.93-99,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4094
2.

Conference Proceedings
Conference Proceedings
2. GaP/Si heterostructures grown by GS-MBE
Yu,J. ; Cheng,B. ; Yu,Z. ; Wang,Q.
Pub. info.: Integrated Optoelectronics II.  pp.9-12,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3551
3.

Conference Proceedings
Conference Proceedings
3. Preparation and photoluminescence of nc-Si/SiO2 MQW
Cheng,B. ; Yu,J. ; Yu,Z. ; Lei,Z. ; Li,D. ; Wang,Q.
Pub. info.: Integrated Optoelectronics II.  pp.13-17,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3551
4.

Conference Proceedings
Conference Proceedings
4. SPER and characteristics of Si1-yCy alloys
Yu,Z. ; Yu,J. ; Cheng,B. ; Lei,Z. ; Li,D. ; Wang,Q. ; Liang,J.
Pub. info.: Integrated Optoelectronics II.  pp.18-22,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3551
5.

Conference Proceedings
Conference Proceedings
5. Normal-incident SiGe/Si MQW photodetectors operating at 1.3ｦﾌm
Cheng,B. ; Li,C. ; Yang,Q. ; Wang,H. ; Luo,L. ; Yu,J. ; Wang,Q.
Pub. info.: Photonics Technology into the 21st Century: Semiconductors, Microstructures, and Nanostructures.  pp.326-329,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3899