1.

Conference Proceedings
Conference Proceedings
1. The Configurational Change of a Metastable S-Cu Defect in Silicon
Chen,W.M. ; Janzen,E. ; Monemar,B. ; Henry,A. ; Frens,A.M. ; Bennebroek,M.T. ; Schmidt,J.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1179-1184,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
2.

Conference Proceedings
Conference Proceedings
2. A Metastable Selenium-Related Center in Silicon
Henry,A. ; Sorman,E. ; Andersson,S. ; Chen,W.M. ; Monemar,B. ; Janzen,E.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.1  pp.159-164,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
3.

Conference Proceedings
Conference Proceedings
3. Important Nonradiative Grown-In Defects in MBE-Grown Si and SiGe/Si Heterostructures
Chen,W.M. ; Buyanova,I.A. ; Henry,A. ; Ni,W.-X. ; Hansson,G.V. ; Monemar,B.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.473-478,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
4.

Conference Proceedings
Conference Proceedings
4. Defect Formation and Recombination Processes in p-Type Modulation-Doped Si Epilayers
Buyanova,I.A. ; Chen,W.M. ; Henry,A. ; Ni,W.X. ; Hansson,G.V. ; Monemar,B.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.479-484,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
5.

Conference Proceedings
Conference Proceedings
5. Magnetic resonance from a metastable sulfur-pair-related complex defect in silicon
Chen,W.M. ; Singh,M. ; Henry,A. ; Janzen,E. ; Monemar,B. ; Frens,A.M. ; Bennebroek,M.T. ; Schmidt,J. ; Reeson,K.J. ; Gwilliam,R.M.
Pub. info.: Proceedings of the 16th International Conference on Defects in Semiconductors : Lehigh University, Bethlehem, Pennsylvania, 22-26 July 1991.  Pt.1  pp.251-256,  1992.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 83-87