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11 results

Conference Proceedings

1. Using long-wavelength (10.6-ｦﾌm) interferometer to test a torus

Gao,Z. ; Chen,J. ; Chen,L. ; Ge,A.

Pub. info.:	Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China. pp.348-352, 1998. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3557

Conference Proceedings

2. Homogeneity measurement using an infrared interferometer

Chen,L. ; Chen,J. ; Huang,S. ; Jin,G.

Pub. info.:	Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.527-531, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2899

Conference Proceedings

3. Novel large-coupled optical cavity semiconductor lasers and multiactive region light-emitting diodes with high performance

Shen,G. ; Lian,P. ; Guo,X. ; Yin,T. ; Chen,C. ; Wang,G. ; Du,J. ; Cui,B. ; Li,J. ; Liu,Y. ; Gao,G. ; Zou,D. ; Chen,J. ; Ma,X. ; Chen,L.

Pub. info.:	Optical interconnects for telecommunication and data communications, 8-10 November 2000, Beijing, China. pp.327-330, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4225

Conference Proceedings

4. Processing technique for interference pattern with step using phase-shift interferometry

Ge,A. ; Chen,L. ; Chen,J. ; Zhu,R.

Pub. info.:	Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China. pp.371-374, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4231

Conference Proceedings

5. Infrared phase-shifting digital interferometer

Chen,J. ; Chen,L. ; Huang,S. ; Jin,G.

Pub. info.:	Automated optical inspection for industry : 6-7 November 1996, Beijing, China. pp.532-538, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	2899

Conference Proceedings

6. Realization of spherical absolute testing

Wang,Q. ; Zhu,R. ; Chen,J. ; Chen,L.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.272-277, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

7. Computer-aided testing for contact-type interferometer

Wang,Q. ; Chen,L. ; Zhu,Y. ; Chen,J. ; Zhu,R.

Pub. info.:	Automated optical inspection for industry: theory, technology, and applications II : 16-19 September, 1998, Beijing, China. pp.283-287, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3558

Conference Proceedings

8. Carbon-doped 980-nm InGaAs strained quantum well lasers grown by metal-organic chemical vapor deposition (Invited Paper)

Yin,T. ; Lian,P. ; Xu,Z. ; Chen,C. ; Zhao,H. ; Zou,D. ; Chen,J. ; Gao,G. ; Du,J. ; Tao,C. ; Shen,G. ; Lu,H. ; Zheng,L. ; Chen,L.

Pub. info.:	Semiconductor Lasers III. pp.48-53, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3547

Conference Proceedings

9. Influence of graded index waveguides on the gain difference between TE0 and TM0 modes of semiconductor optical amplifiers

Chen,C. ; Xu,Z. ; Yin,T. ; Lian,P. ; Zhao,H. ; Gao,G. ; Chen,J. ; Zou,D. ; Shen,G. ; Xu,J. ; Yang,G. ; Chen,L. ; Wang,Q.

Pub. info.:	Semiconductor Lasers III. pp.302-307, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3547

10.

Conference Proceedings

10. High-quality carbon-doped GaAs/AIGaAs material growth by MOCVD and its application for optoelectronic devices

Lian,P. ; Yin,T. ; Xu,Z. ; Zhao,H. ; Zou,D. ; Gao,G. ; Du,J. ; Chen,C. ; Tao,C. ; Chen,J. ; Shen,G. ; Cao,Q. ; Ma,X. ; Chen,L.

Pub. info.:	Semiconductor Lasers III. pp.278-284, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3547

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