1.

Conference Proceedings
Conference Proceedings
1. Fast classification scheme for VQ
Yen, C.C. ; Chang, Y.K. ; Jeng, J.H.
Pub. info.: Applications of digital image processing XXV : 8-10 July 2002, Seattle, Washington, USA.  pp.298-301,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4790
2.

Conference Proceedings
Conference Proceedings
2. Electrical and structural properties of grain boundary in polycrystalline Si
Young, R.T. ; Narayan, J. ; Chang, Y.K.
Pub. info.: Grain boundaries in semiconductors : proceedings of the Materials Research Society annual meeting, November 1981, Boston Park Plaza Hotel, Boston, Massachusetts, U.S.A..  pp.111-117,  1982.  New York.  North-Holland
Title of ser.: Materials Research Society symposia proceedings
Ser. no.: 5