1.

Conference Proceedings
Conference Proceedings
1. Design of a novel star tracker optical system
Liu, X. ; Cai, X. ; Flueraru, C. ; Chang, S. ; Grover, C.P.
Pub. info.: Spaceborne sensors : 13 April 2004, Orlando, Florida, USA.  pp.146-153,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5418
2.

Conference Proceedings
Conference Proceedings
2. Full-field optical coherence tomography using a spatial filter
Liu, X. ; Chang, S. ; Cai, X. ; Grover, C.P.
Pub. info.: Novel optical systems design and optimization VI : 4 August 2003, San Diego, California, USA.  pp.179-186,  2003.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5174
3.

Conference Proceedings
Conference Proceedings
3. Extend focal depth of a tracking lens by phase apodizers [5962-40]
Cai, X. ; Chang, S. ; Flueraru, C.
Pub. info.: Optical Design and Engineering II.  pp.596216-596216,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5962
4.

Conference Proceedings
Conference Proceedings
4. Resolution enhancement for an OCT system applied to multiple-layer information extraction [5969D-86]
Cai, X. ; Chang, S. ; Murdock, E. ; Flueraru, C.
Pub. info.: Photonic Applications in Biosensing and Imaging.  pp.59692D-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5969
5.

Conference Proceedings
Conference Proceedings
5. 2D parallel optical coherence tomography and multiple-layer information extraction [5856-32]
Chang, S. ; Cai, X. ; Murdock, E. ; Flueraru, C.
Pub. info.: Optical Measurement Systems for Industrial Inspection IV.  pp.401-409,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5856
6.

Conference Proceedings
Conference Proceedings
6. Polarimetry: measurements, error analysis, and application [5858-17]
Flueraru, C. ; Cai, X. ; Chang, S.
Pub. info.: Nano- and Micro-Metrology.  pp.58580H-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5858