1.

Conference Proceedings
Conference Proceedings
1. Constant current-stress-induced breakdown of reoxidized nitrided oxide (ONO) in flash memory devices
Cha,C.L. ; Chor,E.F. ; Gong,H. ; Zhang,A.Q. ; Chan,L.H. ; Xie,J.
Pub. info.: Microelectronic Device Technology : 1-2 October 1997, Austin, Texas.  pp.368-375,  1997.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3212
2.

Conference Proceedings
Conference Proceedings
2. Steep retrograde indium channel profiling for high-performance nMOSFETs device fabrication
Ong,S.Y. ; Chor,E.F. ; Leung,Y.K. ; Lee,J. ; Li,W.S. ; See,A. ; Chan,L.H.
Pub. info.: Design, modeling, and simulation in microelectronics : 28-30 November 2000, Singapore.  pp.270-278,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4228