1.

Conference Proceedings
Conference Proceedings
1. EFFECT OF STRESSES ON VOID NUCLEATION DURING ELECTROMIGRATION
Brotzen, F. R. ; Rosenmayer, C. T. ; Dunn, C. F. ; McPherson, J. W.
Pub. info.: Thin films : stresses and mechanical properties III : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.689-694,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 239
2.

Conference Proceedings
Conference Proceedings
2. Electrostatic Adhesion Testing for the Evaluation of Metallization Adhesion
Yang, H. S. ; Brotzen, F. R. ; Callahan, D. L. ; Dunn, C. F.
Pub. info.: Materials reliability in microelectronics VII : symposium held April 8-12, 1997, San Francisco, California, U.S.A..  pp.63-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 473