1.

Conference Proceedings
Conference Proceedings
1. Improved measurement-based modeling of inverted-MSM photodetectors using on-wafer calibration structures
Cha, C. ; Kim, J.H. ; Huang, Z. ; Jokerst, N.M. ; Brooke, M.A.
Pub. info.: Semiconductor photodetectors : 28-29 January 2004, San Jose, California, USA.  pp.89-96,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5353
2.

Conference Proceedings
Conference Proceedings
2. InGaAs MSM photodetectors modeling using DOE analysis
Huang, Z. ; Cha, C. ; Chen, S. ; Sarmiento, T. ; Shen, Jeng Jung ; Jokerst, N.M. ; Brooke, M.A. ; May, G. ; Brown, A.S.
Pub. info.: Optical modeling and performancen predictions : 6-7 August 2003, San Diego, California, USA.  pp.148-155,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5178