1.

Conference Proceedings
Conference Proceedings
1. Dependence of the Residual Strain in GaN on the AlN Buffer Layer Annealing Parameters
Vaillant, Y-M. Le ; Clur, S. ; Andenet, A. ; Briot, O. ; Gil, B. ; Aulombard, R. L. ; Bisaro, R. ; Olivier, J. ; Durand, O. ; Duboz, J-Y.
Pub. info.: Gallium nitride and related materials II : symposium held April 1-4, 1997, San Francisco, California, U.S.A..  pp.173-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 468
2.

Conference Proceedings
Conference Proceedings
2. Influence of Surface Defects on the Characteristics of GaN Schottky Diodes
Duboz, J-Y. ; Binet, F. ; Laurent, N. ; Rosencher, E. ; Scholz, F. ; Harle, V. ; Briot, O. ; Gil, B. ; Aulombard, R. L.
Pub. info.: III-V nitrides : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.1085-,  1997.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 449