1.

Conference Proceedings
Conference Proceedings
1. SYNTHESIS AND PROPERTIES OF ULTRA-THIN YBa2Cu3O7 AND YBa2Cu3O7/La2-XSrXCuO4 MULTILAYERS
Eom, C.B. ; Streiffer, S.K. ; Sun, J.Z. ; Yamamoto, K. ; Laderman, S.S. ; Bravman, J.C. ; Geballe, T.H.
Pub. info.: High-temperature superconductors : fundamental properties and novel materials processing : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A..  pp.557-560,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 169
2.

Conference Proceedings
Conference Proceedings
2. MEASURING THE STRENGTH AND STIFFNESS OF THIN FILM MATERIAL BY MECHANICALLY DEFLECTING CANTILEVER MICROBEAMS
Weihs, T.P. ; Hong, S. ; Bravman, J.C. ; Nix, W.D.
Pub. info.: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.87-92,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 130
3.

Conference Proceedings
Conference Proceedings
3. THE DETERMINATION OF MECHANICAL PARAMETERS AND RESIDUAL SRESSES FOR THIN FILMS USING MICRO-CANTILEVER BEAMS
Hong, S. ; Weihs, T.P. ; Bravman, J.C. ; Nix, W.D.
Pub. info.: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.93-98,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 130
4.

Conference Proceedings
Conference Proceedings
4. Modeling the Transient Diffusion Behavior of Beryllium in Gallium Arsenide and the Effect of Encapsulant Material on Non-Equilibrium Point Defect Populations
Haddara, Y.M. ; Deal, M.O. ; Bravman, J.C.
Pub. info.: Proceedings of the Fourth International Symposium on Process Physics and Modeling in Semiconductor Technology.  pp.142-148,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-4
5.

Conference Proceedings
Conference Proceedings
5. AN HREM STUDY OF EPITAXIAL FLUORIDE/RARE EARTH/FLUORIDE/GaAs INTERFACES
Chien, C.J. ; Farrow, R.F.C ; Bravman, J.C.
Pub. info.: Layered structures : heteroepitaxy, superlattices, strain, and metastability : symposium held November 27-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.513-520,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 160
6.

Conference Proceedings
Conference Proceedings
6. TRANSMISSION ELECTRON MICROSCOPY AND X-RAY DIFFRACTION STUDIES OF a,b-AXIS ORIENTED YBa2Cu3O7-δ FILMS
Streiffer, S.K. ; Lairson, B.M. ; Zielinski, E.M. ; Bravman, J.C.
Pub. info.: Layered superconductors : fabrication, properties, and applications : symposium held April 27-May 1, 1992, in San Francisco, California, U.S.A..  pp.771-776,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 275
7.

Conference Proceedings
Conference Proceedings
7. LONG-RANGE COERENCY STRAIN AND TITLED EPIZIAL IN Ag-Fe-Ag SANDWICH STRUCTURE ON GaAS (001) SUBSTRATES
Farrow, R.F.C. ; Speriosu, V.S. ; Parkin, S.S.P. ; Chien,C. ; Bravman, J.C. ; Marks, R.F. ; Kirchner, P.D. ; Prinz, G.A. ; Jonker, B.T.
Pub. info.: Thin films : stresses and mechanical properties : symposium held November 28-30, 1988, Boston, Massachusetts, U.S.A..  pp.281-288,  1989.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 130
8.

Conference Proceedings
Conference Proceedings
8. MOLECULAR BEAM EPITAXY OF LAYERED Bi-Sr-Ca-Cu-O COMPOUNDS
Schlom, D.G. ; Eckstein, J.N. ; Bozovic, I. ; Marshall, A.F. ; Sizemore, J.T. ; Chen, Z.J. ; von Dessonneck, K.E. ; Harris, J.r., J.S. ; Bravman, J.C.
Pub. info.: High-temperature superconductors : fundamental properties and novel materials processing : symposium held November 27-December 2, 1989, Boston, Massachusetts, U.S.A..  pp.711-714,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 169
9.

Conference Proceedings
Conference Proceedings
9. Microtexture And Strain In Electroplated Copper Interconnects
Spolenak, R. ; Barr, D.L. ; Gross, M.E. ; Evans-Lutterodt, K. ; Brown, W.L. ; Tamura, N. ; Macdowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Valek, B.C. ; Bravman, J.C. ; Flinn, P. ; Marieb, T. ; Keller, R.R. ; Batterman, B.W. ; Patel, J.R.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D10.3/G7.3-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
10.

Conference Proceedings
Conference Proceedings
10. Microtexture and Strain in Electroplated Copper Interconnects
Spolenak, R. ; Barr, D.L. ; Gross, M.E. ; Evans-Lutterodt, K. ; Brown, W.L. ; Tamura, N. ; Macdowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Valek, B.C. ; Bravman, J.C. ; Flinn, P. ; Marieb, T. ; Keller, R.R. ; Batterman, B.W. ; Patel, J.R.
Pub. info.: Polycrystalline metal and magnetic thin films-2000 : symposium held April 25-27, 2000, San Francisco, California, U.S.A..  pp.G7.3/D10.3-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 615
11.

Conference Proceedings
Conference Proceedings
11. Diffusion of Implanted Be in AlxGa1-xAs as a Function of Al Concentration
Lee, C.C. ; Deal, M.D. ; Bravman, J.C.
Pub. info.: Proceedings of the Twenty-first State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXI).  pp.85-95,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-34
12.

Conference Proceedings
Conference Proceedings
12. Local Microstructure and Stress in Al(Cu) Thin Film Structures Studied by X-Ray Microdiffraction
Valek, B.C. ; Tamura, N. ; Spolenak, R. ; MacDowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Bravman, J.C. ; Brown, W.L. ; Batterman, B. W. ; Patel, J. R.
Pub. info.: Dislocations and deformation mechanisms in thin films and small structures : symposium held April 17-19, 2001, San Francisco, California, U.S.A..  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 673
13.

Conference Proceedings
Conference Proceedings
13. A New Model for the Anomalous Diffusion of Grown-In Magnesium in GaAs
Haddara, Y.M. ; Deal, M.D. ; Robinson, H.G. ; Bravman, J.C.
Pub. info.: Proceedings of the Twenty-first State-of-the-Art Program on Compound Semiconductors (SOTAPOCS XXI).  pp.96-107,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-34
14.

Conference Proceedings
Conference Proceedings
14. Thin Film Stress Measurement With a Tunneling Sensor
Zhang, P. ; Vinci, R.P. ; Bravman, J.C. ; Kenny, T.W.
Pub. info.: Materials science of microelectromechanical systems (MEMS) devices : symposium held December 1-2, 1998, Boston, Massachusetts, U.S.A..  pp.45-50,  1999.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 546
15.

Conference Proceedings
Conference Proceedings
15. Grain Orientation And Strain Measurements In Sub-Micron Wide Passivated Individual Aluminum Test Structures
Tamura, N. ; Valek, B.C. ; Spolenak, R. ; MacDowell, A.A. ; Celestre, R.S. ; Padmore, H.A. ; Brown, W.L. ; Marieb, T. ; Bravman, J.C. ; Batterman, B.W. ; Patel, J.R.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics : symposium held April 23-27, 2000, San Francisco, California, U.S.A..  pp.D8.8-,  2001.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 612
16.

Conference Proceedings
Conference Proceedings
16. FINITE ELEMENT MODELIG AND Z-RAY MEASUREMENT OF STRAIN IN PASSIVATED ALUMINUM LINES DURING
Besser, P.R. ; Mack, A.S. ; Fraser, D. ; Bravman, J.C.
Pub. info.: Proceedings of the Third International Symposium on Process Physics and Modeling in Semiconductor Technology.  pp.251-262,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-6
17.

Conference Proceedings
Conference Proceedings
17. Spatially Resolved Characterization of Electromigration-Induced Plastic Deformation in Al (0.5wt% Cu) Interconnect
Barabash, R.I. ; Ice, G.E. ; Tamura, N. ; Patel, J.R. ; Valek, B.C. ; Bravman, J.C. ; Spolenak, R.
Pub. info.: Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A..  pp.345-700,  2003.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 738
18.

Conference Proceedings
Conference Proceedings
18. Coupling Between Precipitation and Plastic Deformation During Electromigration in a Passivated Al (0.5wt%Cu) Interconnect
Barabash, R.I. ; Ice, G.E. ; Tamura, N. ; Valek, B.C. ; Spolenak, R. ; Bravman, J.C. ; Patel, J.R.
Pub. info.: Materials, technology and reliability for advanced interconnects and low-k dielectrics - 2004 : symposium held April 13-15, 2004, San Francisco, California, U.S.A..  pp.351-360,  2004.  Warrendale.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 812