1.

Conference Proceedings
Conference Proceedings
1. INFLUENCE OF POLYSILICON AND CRUCIBLE PURITY ON THE MINORITY CARRIER RECOMBINATION LIFETIME OF CZOCHRALSKI SILICON CRYSTALS
Borionetti, G. ; Porrini, M. ; Geranzani, P. ; Orizio, R. ; Falster, R.
Pub. info.: Proceedings of the Seventh International Symposium on Silicon Materials Science and Technology.  pp.104-110,  1994.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1994-10
2.

Conference Proceedings
Conference Proceedings
2. Gate oxide Integrity Response as a Function of Near the Surface Crystal Defects Morphology
Borionetti, G. ; Godio, P. ; Bonoli, F. ; Comara, M. ; Orizio, R. ; Falster, R.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.456-466,  2000.  Bellingham, Wash..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-17
3.

Conference Proceedings
Conference Proceedings
3. Impact of silicon substrate oxygen precipitation fine tuning on high density memories retention time
Borionetti, G. ; Falster, R. ; Bertolini, S. ; Cornara, M. ; Olmo, M. ; Chalmers, G. ; Childs, R. ; Marcuccilli, G.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.196-203,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22