Miller, A.C. ; Farr, M.D. ; Bishop, M. ; Williams, D.
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Remote sensing for agriculture, ecosystems, and hydrology V : 8-10 September 2003, Barcelona, Spain. pp.333-339, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Allgair, J. A. ; Bunday, B. D. ; Bishop, M. ; Lipscomb, P. ; Orji, N. G.
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Metrology, Inspection, and Process Control for Microlithography XX. pp.61520C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Silver, R.M. ; Stocker, M.T. ; Attota, R. ; Bishop, M. ; Jun, J.-S.J. ; Marx, E. ; Davidson, M.P. ; Larrabee, R.D.
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Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.103-120, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.674-688, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVII. 2 pp.793-802, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Maldonado, J.-L. ; Bishop, M. ; Fuentes-Hernandez, C. ; Domercq, B. ; Barlow, S. ; Thayumanavan, S. ; Malagoli, M. ; Manoharan, M. ; Bredas, J.-L. ; Marder, S.R. ; Kippelen, B.
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Organic Photorefractive and Photosensitive Materials for Holographic Applications. pp.42-50, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Process and Materials Characterization and Diagnostics in IC Manufacturing. pp.115-126, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Process and Materials Characterization and Diagnostics in IC Manufacturing. pp.127-141, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVII. 2 pp.1038-1052, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.102-115, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.151-172, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVIII. pp.199-209, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Silver, R.M. ; Attota, R. ; Stocker, M. ; Bishop, M. ; Jun, J.-S.J. ; Marx, E. ; Davidson, M.P. ; Larrabee, R.D.
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Metrology, Inspection, and Process Control for Microlithography XVIII. pp.78-95, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bunday, B.D. ; Bishop, M. ; McCormack, D.W., Jr. ; Villarrubia, J.S. ; Vladar, A.E. ; Dixson, R. ; Vorburger, T.V. ; Orji, N.G. ; Allgair, J.A.
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Metrology, Inspection, and Process Control for Microlithography XVIII. pp.515-533, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Attota, R. ; Silver, R.M. ; Bishop, M. ; Marx, E. ; Jun, J.-S.J. ; Stocker, M. ; Davidson, M.P. ; Larrabee, R.D.
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Metrology, Inspection, and Process Control for Microlithography XVIII. pp.395-402, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.383-395, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Bunday, B.D. ; Bishop, M. ; Bennett, M.H. ; Swyers, J.R. ; Haberman-Golan, Z.
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Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.138-150, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Russo, B. ; Bishop, M. ; Benoit, D.C. ; Silver, R.M.
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Metrology, Inspection, and Process Control for Microlithography XVI. Part One pp.261-272, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering