Miller, A.C. ; Farr, M.D. ; Bishop, M. ; Williams, D.
Pub. info.:
Remote sensing for agriculture, ecosystems, and hydrology V : 8-10 September 2003, Barcelona, Spain. pp.333-339, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Allgair, J. A. ; Bunday, B. D. ; Bishop, M. ; Lipscomb, P. ; Orji, N. G.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XX. pp.61520C-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Silver, R.M. ; Stocker, M.T. ; Attota, R. ; Bishop, M. ; Jun, J.-S.J. ; Marx, E. ; Davidson, M.P. ; Larrabee, R.D.
Pub. info.:
Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.103-120, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVII. 1 pp.674-688, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVII. 2 pp.793-802, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Maldonado, J.-L. ; Bishop, M. ; Fuentes-Hernandez, C. ; Domercq, B. ; Barlow, S. ; Thayumanavan, S. ; Malagoli, M. ; Manoharan, M. ; Bredas, J.-L. ; Marder, S.R. ; Kippelen, B.
Pub. info.:
Organic Photorefractive and Photosensitive Materials for Holographic Applications. pp.42-50, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Process and Materials Characterization and Diagnostics in IC Manufacturing. pp.115-126, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Process and Materials Characterization and Diagnostics in IC Manufacturing. pp.127-141, 2003. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Metrology, Inspection, and Process Control for Microlithography XVII. 2 pp.1038-1052, 2003. Bellingham, WA. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering