Edelman, F. ; Cytermann, C. ; Brener, R. ; Eizenberg, M. ; Weil, R. ; Beyer, W.
Pub. info.:
Kinetics of phase transformations : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.. pp.281-288, 1992. Pittsburgh, Pa.. Materials Research Society
Finger, F. ; Viret, V. ; Shah, A. ; Tang, X.-M. ; Weber, J. ; Beyer, W.
Pub. info.:
Amorphous silicon technology, 1990 : symposium held April 17-20, 1990, San Francisco, California, U.S.A.. pp.583-588, 1990. Pittsburgh, Pa.. Materials Research Society
Amorphous insulating thin films : symposium held December 1-4, 1992, Boston, Massachusetts, U.S.A.. pp.395-400, 1993. Pittsburgh, Pa.. Materials Research Society
Edelman, F. ; Cytermann, C. ; Brener, R. ; Eizenberg, M. ; Weil, R. ; Beyer, W.
Pub. info.:
Kinetics of phase transformations : symposium held November 26-29, 1990, Boston, Massachusetts, U.S.A.. pp.75-80, 1992. Pittsburgh, Pa.. Materials Research Society
Amorphous silicon technology, 1993 : Symposium held April 13-16, San Francisco, California, U.S.A.. pp.285-290, 1993. Pittsburgh, Pa.. Materials Research Society
Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.. pp.A23.4-, 2001. Warrendale. Materials Research Society
Beck, Tobias J. ; Beyer, W. ; Pongratz, T. ; Stummer, W. ; Waidelich, R.M. ; Stepp, H. ; Wagner, S. ; Baumgartner, R.
Pub. info.:
Photon migration and diffuse-light imaging : 22-23 June 2003, Munich, Germany. pp.96-105, 2003. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Amorphous silicon semiconductors -- Pure and hydrogenated : symposium held April 21-24, 1987, Anaheim, California, U.S.A.. pp.317-322, 1987. Pittsburgh, Pa.. Materials Research Society
Materials issues in applications of amorphous silicon technology : symposium held April 15-17, 1985, San Francisco, California, U.S.A.. pp.189-194, 1985. Pittsburgh, Pa.. Materials Research Society
Amorphous silicon technology, 1996 : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.497-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Edelman, F. ; Brener, R. ; Cytermann, C. ; Weil, R. ; Beneking, C. ; Beyer, W.
Pub. info.:
Amorphous silicon technology, 1996 : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.849-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Blum, T. ; Suchaneck, G. ; Kuske, J. ; Stephan, U. ; Beyer, W. ; Kottwitz, A.
Pub. info.:
Amorphous silicon technology, 1996 : symposium held April 8-12, 1996, San Francisco, California, U.S.A.. pp.369-, 1996. Pittsburgh, Pa.. MRS - Materials Research Society
Amorphous and microcrystalline silicon technology - 1998 : symposium held April 14-17, 1998, San Francisco, California, U.S.A.. pp.601-, 1999. Warrendale. MRS - Materials Research Society
Amorphous and microcrystalline silicon technology - 1998 : symposium held April 14-17, 1998, San Francisco, California, U.S.A.. pp.679-, 1999. Warrendale. MRS - Materials Research Society
Beserman, R. ; Beyer, W. ; Chack, A. ; Edelman, F. ; Rech, B. ; Roschek, T. ; Weil, R. ; Werner, P.
Pub. info.:
Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.. pp.A5.8-, 2001. Warrendale. Materials Research Society
Mahan, A.H. ; Xu, Y. ; Iwaniczko, E. ; Williamson, D.L. ; Beyer, W. ; Perkins, J.D. ; Vanecek, M. ; Gedvilas, L.M. ; Nelson, B.P.
Pub. info.:
Amorphous and heterogeneous silicon-based films - 2001 : symposium held April 16-20, 2001, San Francisco, California, U.S.A.. 2001. Warrendale. Materials Research Society
Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.. pp.A20.4-, 2001. Warrendale. Materials Research Society
Beyer, W. ; Dasgupta, A. ; Finger, F. ; Lambertz, A. ; Ray, S. ; Vetterl, O. ; Zastrow, U.
Pub. info.:
Amorphous and heterogeneous silicon thin films - 2000 : symposium held April 24-28, 2000, San Francisco, California, U.S.A.. pp.A13.5-, 2001. Warrendale. Materials Research Society
Edelman, F. ; Borner, F. ; Krause-Rehrberg, R. ; Werner, P. ; Weil, R. ; Beyer, W. ; Botz, R.
Pub. info.:
Nanophase and nanocomposite materials III : symposium held November 29-December 2, 1999, Boston, Massachusetts, U.S.A.. pp.187-, 2000. Pittsburgh, Pa.. MRS-Materials Research Society
Folsch, J. ; Finger, F. ; Kulessa, T. ; Siebke, F. ; Beyer, W. ; Wagner, H.
Pub. info.:
Amorphous silicon technology, 1995 : Symposium held April 18-21, 1995, San Francisco, California, U.S.A.. pp.517-, 1995. Pittsburgh, Pa.. MRS - Materials Research Society
Edelman, F. ; Brener, R. ; Cytermann, C. ; Eizenberg, M. ; Weil, R. ; Beyer, W.
Pub. info.:
Advanced metallization for devices and circuits--science, technology, and manufacturability : symposium held April 4-8, 1994, San Francisco, California, U.S.A.. pp.589-, 1994. Pittsburgh, Pa.. MRS - Materials Research Society
Neto, A. L. Baia ; Santos, R. A. ; Freire, F. L., Jr. ; Beyer, W. ; Camargo, S. S., Jr.
Pub. info.:
Novel forms of carbon II : symposium held April 4-8, 1994, San Francisco, California, U.S.A.. pp.529-, 1994. Pittsburgh. MRS - Materials Research Society
Edelman, F. ; Raz, T. ; Komem, Y. ; Werner, P. ; Beyer, W. ; Butz, R. ; Zeindl, H. ; Zaumseil, P.
Pub. info.:
Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A.. pp.529-, 1997. Pittsburg, Pa.. MRS - Materials Research Society
Stepp, H. ; Beck, T. ; Beyer, W. ; Pfaller, C. ; Sroka, R. ; Baumgartner, R.
Pub. info.:
Optical Methods for Tumor Treatment and Detection: Mechanisms and Techniques in Photodynamic Therapy XV. pp.61390S-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Stepp, H. G. ; Beck, T. ; Beyer, W. ; Pongratz, T. ; Sroka, R. ; Baumgartner, R. ; Stummer, W. ; Olzowy, B. ; Mehrkens, J. H. ; Tonn, J. Ch. ; Reulen, H. J.
Pub. info.:
Photonic Therapeutics and Diagnostics. pp.547-557, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering