Polarimetry and ellipsometry : 20-23 May, 1996, Kazimierz Dolny, Poland. pp.169-174, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
International Conference on Optical Diagnostics of Materials and Devices for Opto-, Micro-, and Quantum Electronics. pp.622-627, 1995. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering