1.

Conference Proceedings
Conference Proceedings
1. Analysis of deep levels in GaAs detector diodes using impedance spectroscopy
Eiche, C. ; Fiederle, M. ; Weese, J. ; Maier, D. ; Ebling, D. ; Ludwig, J. ; Benz, K. W.
Pub. info.: Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.375-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 302
2.

Conference Proceedings
Conference Proceedings
2. Investigation of Resistivity Distributions in CdTe Crystals by Time Dependent Charge Measurements (TDCM)
Eiche, C. ; Joerger, W. ; Fiederle, M. ; Schwarz, R. ; Salk, M. ; Ebling, D. G. ; Benz, K. W.
Pub. info.: Defect and impurity engineered semiconductors and devices : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.77-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 378
3.

Conference Proceedings
Conference Proceedings
3. Investigation of deep levels in X-ray detector material with Photo Induced Current Transient Spectroscopy (PICTS)
Eiche, C. ; Fiederle, M. ; Wesse, J. ; Maier, D. ; Ebling, D. ; Benz, K. W.
Pub. info.: Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.231-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 302
4.

Conference Proceedings
Conference Proceedings
4. CdTe:Cl and CdTeSe:Cl single crystals application for radiation detectors
Meyer, B. K. ; Hofmann, D. M. ; Stadler, W. ; Salk, M. ; Eiche, C. ; Benz, K. W.
Pub. info.: Semiconductors for room-temperature radiation detector applications : symposium held April 12-16, 1993, San Francisco, California, U.S.A..  pp.189-,  1993.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 302