1.

Conference Proceedings
Conference Proceedings
1. MOS C-t characteristics and gate oxide quality versus bulk iron contamination in epitaxial wafers
Bellutti, P. ; Collini, A. ; Zorzi, N. ; Vaccari, G. ; Crippa, D.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.209-217,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22
2.

Conference Proceedings
Conference Proceedings
2. Gate oxide quality improvement nearby bird's beak region
Bellutti, P. ; Collini, A. ; Ferrario, L. ; Zorzi, N ; Zen, M.
Pub. info.: Proceedings of the Symposium on Crystalline Defects and Contamination, their Impact and Control in Device Manufacturing II.  pp.204-208,  1997.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 97-22