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Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering. pp.125-128, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering. pp.143-145, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Fourth International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering. pp.119-124, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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International Workshop on New Approaches to High-Tech Materials, Nondestructive Testing and Computer Simulations in Materials Science and Engineering : 9-13 June 1997, St. Petersburg, Russia. pp.166-174, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia. pp.112-121, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 8-12 June 1998, St. Petersburg, Russia. pp.105-111, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia. pp.129-134, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia. pp.135-139, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Third International Workshop on Nondestructive Testing and Computer Simulations in Science and Engineering : 7-11 June 1999, St. Petersburg, Russia. pp.119-128, 2000. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
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Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part3 pp.1361-1365, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
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Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1683-1688, 1997. Zurich, Switzerland. Trans Tech Publications
Defects in semiconductors, icds-19 : proceedings of the 19th International Conference on Defects in Semiconductors, Aveiro, Portugal, July 1997. Part3 pp.1607-1612, 1997. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988. Part3 pp.1125-1130, 1989. Aederlmannsdorf, Switzwelns. Trans Tech Publications
Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993. Pt.1 pp.543-548, 1994. Zurich, Switzerland. Trans Tech Publications
Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995. pp.467-472, 1995. Zurich, Switzerland. Trans Tech Publications
Tenth Feofilov Symposium on Spectroscopy of Crystals Activated by Rare-Earth and Transitional-Metal Ions. pp.251-259, 1996. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering