1.

Conference Proceedings
Conference Proceedings
1. Micro-moire methods: optical and scanning techniques
Asundi,A.K. ; Xie,H. ; Li,C. ; Chai,G.B. ; Oh,K.E.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.54-57,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
2.

Conference Proceedings
Conference Proceedings
2. Development and application of micro-moire interferometer
Oh,K.E. ; Chai,G.B. ; Asundi,A.K. ; Chan,K.C. ; Chai,T.C.
Pub. info.: Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore.  pp.650-657,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3897
3.

Conference Proceedings
Conference Proceedings
3. Thermal deformation measurement of electronic packaging component using AFM scanning moire method
Hie,H. ; Chai,G.B. ; Asundi,A.K. ; Jin,Y. ; Lu,Y. ; Ngoi,B.K.A. ; Zhong,Z.
Pub. info.: Second International Conference on Experimental Mechanics : 29 November-1 December 2000, Singapore.  pp.180-185,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4317
4.

Conference Proceedings
Conference Proceedings
4. Measurement of residual in polymer composites using moire interferometry
Shankar,K. ; Xie,H. ; Asundi,A.K. ; Oh,K.E. ; Chai,G.B.
Pub. info.: Second International Conference on Experimental Mechanics : 29 November-1 December 2000, Singapore.  pp.198-203,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4317
5.

Conference Proceedings
Conference Proceedings
5. Photoelastic stress analysis of internal fixation techniques for femur shaft crack
Liu,T. ; Chai,G.B. ; Asundi,A.K. ; murugiah,A.
Pub. info.: Second International Conference on Experimental Mechanics : 29 November-1 December 2000, Singapore.  pp.451-456,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4317
6.

Conference Proceedings
Conference Proceedings
6. AFM scanning moire method for nanodeformation measurement
Xie,H. ; Chai,G.B. ; Asundi,A.K. ; Yu,J. ; Lu,Y. ; Ngoi,B.K.A. ; Zhong,Z. ; Kishimoto,S.
Pub. info.: Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA.  Part A  pp.140-148,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4101