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13 results

Conference Proceedings

1. Electrochemical Tailoring and Optical Investigation of Advanced Refractive Index Profiles in Porous Silicon Layers

Arwin, H. ; Jansson, R. ; Zangooie, S.

Pub. info.:	Amorphous and heterogeneous silicon thin films : fundamentals to devices - 1999 : symposium held April 5-9, 1999, San Francisco, California, U.S.A.. pp.195-200, 1999. Warrendale. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	557

Conference Proceedings

2. GROWTH OF Ge/Si AMORPHOUS SUPERLATTICES BY DUAL-TARGET DC MAGNETRON SPUTTERING

Jarrendahl, K. ; Birch, J. ; Hultman, L. ; Wallenberg, L.R. ; Radnoczi, G. ; Arwin, H. ; Sundgren, J-E.

Pub. info.:	Amorphous silicon technology, 1992. pp.571-576, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	258

Conference Proceedings

3. AMORPHOUS Ge/Si MULTILAYER STRUCTURES AS MODELS FOR OPTICAL MEMORIES

Jarrendahl, K. ; Jansson, R. ; Sundgren, J.-E. ; Arwin, H.

Pub. info.:	Amorphous silicon technology, 1992. pp.535-540, 1992. Pittsburgh, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	258

Conference Proceedings

4. Microstructural Analysis and Modelling of Thin Porous Silicon Layers with Variable Angle Spectroscopic Ellipsometry

Pettersson, L. A. A. ; Zangooie, S. ; Bjorklund, R. ; Arwin, H.

Pub. info.:	Microporous and macroporous materials. pp.259-, 1996. Pittsburgh, PA. MRS - Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	431

Conference Proceedings

5. Strain Evolution and Phonons in AlN/GaN Superlattices

Darakchieva, V. ; Paskov, P.P. ; Schubert, M. ; Valcheva, B. ; Paskova, T. ; Arwin, H. ; Monemar, B. ; Amano, H. ; Akasaki, I.

Pub. info.:	GaN and related alloys - 2003 : symposium held December 1-5, 2003, Boston, Massachusetts, U.S.A.. pp.741-746, 2004. Warrendale, Pa.. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	798

Conference Proceedings

6. Microstructural, Optical and Electronic Investigation of Anodized 4H-SiC

Zangooie, S. ; Persson, P. O. A. ; Hilfiker, J. N. ; Hultman, L. ; Arwin, H. ; Wahab, Q.

Pub. info.:	Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999. pp.537-540, 2000. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	338-342(1)

Conference Proceedings

7. Optical Characterization of 4H-SiC by Variable Angle of Incidence Spectroscopic Ellipsometry

Lindquist, O. P. A. ; Arwin, H. ; Forsberg, U. ; Bergman, J. P. ; Jarrendahl, K.

Pub. info.:	Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999. pp.575-578, 2000. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	338-342(1)

Conference Proceedings

8. Ozone Treament of SiC for Improved Performance of Gas Sensitive Schottky Diodes

Zangooie, S. ; Arwin, H. ; Lundstrom, I. ; Spetz, A. L.

Pub. info.:	Silicon carbide and related materials - 1999 : ICSCRM'99, proceedings of the International Conference on Silicon Carbide and Related Materials - 1999, Research Triangle Park, North Carolina, USA, October 10-15, 1999. pp.1085-1088, 2000. Zuerich, Switzerland. Trans Tech Publications
Title of ser.:	Materials science forum
Ser. no.:	338-342(2)

Conference Proceedings

9. Intrinsic, n- and p-Doped a-Si:H Thin Films Grown by dc Magnetron Sputtering With Doped Targets

Arwin, H. ; Birch, J. ; Hjorvarsson, B. ; Jarrendahl, K. ; Johansson, A. A.

Pub. info.:	Amorphous and heterogeneous silicon thin films : fundamentals to devices - 1999 : symposium held April 5-9, 1999, San Francisco, California, U.S.A.. pp.31-36, 1999. Warrendale. Materials Research Society
Title of ser.:	Materials Research Society symposium proceedings
Ser. no.:	557

10.

Conference Proceedings

10. Total Internal Reflection Ellipsometry - a Tool for in Situ Corrosion Studies

Poksinsk, M. ; Dzuho, H. ; Arwin, H.

Pub. info.:	Corrosion and corrosion protection : proceedings of the international symposium. pp.1002-1008, 2001. Pennington, N.J.. Electrochemical Society
Title of ser.:	Electrochemical Society Proceedings Series
Ser. no.:	2001-22

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