1.

Conference Proceedings
Conference Proceedings
1. CHARACTERIZATION OF HIGH Ge CONTENT SiGe HETEROSTRUCTURES AND GRADED ALLOY LAYERS USING SPECTROSCOPIC ELLIPSOMETRY
Heyd, A. R. ; Alterovitz, S. A. ; Croke, E. T.
Pub. info.: Microcrystalline and nanocrystalline semiconductors : Symposium held November 29-December 2, 1994, Boston, Massachusetts, U.S.A..  pp.993-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 358
2.

Technical Paper
Technical Paper
2. Characterization of High Ge Content SiGe Heterostructures and Graded Alloy Layers Using Spectroscopic Ellipsometry
Heyd, A. R. ; Alterovitz, S. A. ; Croke, E. T.
Pub. info.: NASA Technical Reports.  19970005485  (NASA-TM-112114),  pp.1-8,  1995.  National Aeronautics and Space Adminstration
3.

Technical Paper
Technical Paper
3. Characterization of SiGe/Ge heterostructures and graded layers using variable angle spectroscopic ellipsometry
Croke, E. T. ; Wang, K. L. ; Heyd, A. R. ; Alterovitz, S. A. ; Lee, C. H.
Pub. info.: NASA Technical Reports.  19960038261  (NASA-TM-111685),  pp.1-8,  1996.  National Aeronautics and Space Adminstration