1.

Conference Proceedings
Conference Proceedings
1. Fine-granularity-scalability for wireless video and scalable storage
van der Schaar, M. ; Meehan, J.
Pub. info.: Visual communications and image processing 2002 : 21-23 January 2002, San Jose, USA.  pp.805-816,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4671
2.

Conference Proceedings
Conference Proceedings
2. Adaptive frequency weighting for fine-granularity-scalability
Peng, S.S. ; van der Schaar, M.
Pub. info.: Visual communications and image processing 2002 : 21-23 January 2002, San Jose, USA.  pp.840-849,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4671
3.

Conference Proceedings
Conference Proceedings
3. Complexity analysis of scalable motion-compensated wavelet video decoders
Landge, G. ; van der Schaar, M. ; Akella, V.
Pub. info.: Applications of digital image processing XXVII : 2-6 August 2004, Denver, Colorado, USA.  pp.444-453,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5558
4.

Conference Proceedings
Conference Proceedings
4. Optimal media sharing policies in peer-to-peer networks
Sood, R. ; van der Schaar, M.
Pub. info.: Applications of digital image processing XXVII : 2-6 August 2004, Denver, Colorado, USA.  pp.435-443,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5558
5.

Conference Proceedings
Conference Proceedings
5. Advances in process overlay on 300-mm wafers
Staecker, J. ; Arendt, S. ; Schumacher, K. ; Mos, E.C. ; van Haren, R.J. ; van der Schaar, M. ; Edart, R. ; Demmerie, W. ; Tolsma, H.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVI.  Part Two  pp.927-936,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4689
6.

Conference Proceedings
Conference Proceedings
6. A comparative study of scalable video coding schemes utilizing wavelet technology
Schelkens, P. ; Andreopoulos, Y. ; Barbarien, J. ; Clerckx, T. ; Verdicchio, F. ; Munteanu, A. ; van der Schaar, M.
Pub. info.: Wavelet Applications in Industrial Processing.  pp.147-156,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5266
7.

Conference Proceedings
Conference Proceedings
7. Predicting optimal operation of MC-3DSBC multidimensional scalable video coding using subjective quality measurement
Wang, Y. ; Ng, T.-T. ; van der Schaar, M. ; Chang, S.-F.
Pub. info.: Visual Communications and Image Processing 2004.  pp.529-542,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5308
8.

Conference Proceedings
Conference Proceedings
8. Reduced complexity genetic algorithm for motion estimation
Khanna, R. ; van der Schaar, M.
Pub. info.: Visual Communications and Image Processing 2004.  pp.474-485,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5308
9.

Conference Proceedings
Conference Proceedings
9. Arithmetic coding with adaptive context-tree weighting for the H.264 video coders
Hong, D. ; van der Schaar, M. ; Pesquet-Popescu, B.
Pub. info.: Visual Communications and Image Processing 2004.  pp.1226-1235,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5308