Wahl, U. ; Correia, J. G. ; Wachter, J. De ; Langouche, G. ; Marques, J. G. ; Moons, R. ; Vantomme, A. ; the ISOLDE Collaboration
Pub. info.:
Defects and diffusion in silicon processing : symposium held April 1-4, 1997, San Francisco, California, U.S.A.. pp.407-, 1997. Pittsburg, Pa.. MRS - Materials Research Society
Wahl, U. ; Correia, J. G. ; Langouche, G. ; Vantomme, A. ; the ISOLDE Collaboration
Pub. info.:
Materials and devices for silicon-based optoelectronics : symposium held December 1-3, 1997, Boston, Massachusetts, U.S.A.. pp.269-, 1998. Warrendale, Pa.. MRS - Materials Research Society
Rita, Elisabete M.C. ; Wahl, Ulrich ; Lopes, Armandina L. ; Araujo, Joao P. ; Correia, Joao G. ; Alves, Edward ; Soares, Jose C. ; the ISOLDE Collaboration
Pub. info.:
Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.. pp.105-110, 2003. Warrendale, Pa.. Materials Research Society
Vetter, U. ; Taniguchi, T. ; Wahl, U. ; Correia, J. ; Muller, A. ; Ronning, C. ; Hofsass, H. ; Dietrich, M. ; the ISOLDE Collaboration
Pub. info.:
Progress in semiconductors II : electronic and optoelectronic applications : symposium held December 2-5, 2002, Boston, Massachusetts, U.S.A.. pp.555-560, 2003. Warrendale, Pa.. Materials Research Society