1.

Conference Proceedings
Conference Proceedings
1. Lithium-Ion Drifting: Application to the Study of Point Defects in Floating-Zone Silicon
Walton,J.T. ; Haller,E.E. ; Knowlton,W.B. ; Wong,Y.K. ; Ammon,W.V. ; Zulehner,W.
Pub. info.: Proceedings of the Electrochemical Society Symposium on Diagnostic Techniques for Semiconductor Materials and Devices.  pp.400-411,  1997.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3322
2.

Conference Proceedings
Conference Proceedings
2. Radial Distributions of Transition Metal Defects in Float Zone Silicon Crystals
Lemke,H. ; Zulehner,W. ; Hallmann,B.
Pub. info.: High Purity Silicon VI : proceedings of the sixth International Symposium.  pp.244-257,  2000.  Pennington, N.J., Bellingham, Wash..  Electrochemical Society — SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4218
3.

Conference Proceedings
Conference Proceedings
3. Observation of Five Additional Thermal Donors and Kinetics of Thermal Donor Formation and Annihilation at Temperatures above 500｡？in Czochralski-Grown Si
Gotz,W. ; Pensl,G. ; Zulehner,W.
Pub. info.: Shallow Impurities in Semiconductors : Proceedings of the Fifth International Conference on Shallow Impurities in Semiconductors "Physics and Control of Impurities", International Conference Center Kobe, Japan, 5 to 8 August, 1992.  pp.213-218,  1993.  Aedermannsdorf, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 117-118
4.

Conference Proceedings
Conference Proceedings
4. Oxygen-Carbon Interactions in Silicon:Photoluminescence Defect Spectrum at 1.06 eV Emission Energy
Ktrner,W. ; Sauer,R. ; Thonke,K. ; Asom,M.T. ; Zulehner,W.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.159-164,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
5.

Conference Proceedings
Conference Proceedings
5. On the Pairing between Indium and Carbon Atoms in Silicon
Ott,U. ; Wolf,H. ; Krings,Th. ; Wichert,Th. ; Haｦﾂlein,H. ; Sielemann,R. ; Deicher,M. ; Newman,R.C. ; Zulehner,W.
Pub. info.: Proceedings of the 17th International Conference on Defects in Semiconductors : ICDS-17, Gmunden, Austria, July 18-23, 1993.  Pt.2  pp.1251-1256,  1994.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 143-147
6.

Conference Proceedings
Conference Proceedings
6. Microdefects in Nitrogen Doped FZ Silicon Revealed by Li+ Drifting
Knowlton,W.B. ; Walton,J.T. ; Lee,J.S. ; Wong,Y.K. ; Haller,E.E. ; Ammon,W.v. ; Zulehner,W.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1761-1766,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201