1.

Conference Proceedings
Conference Proceedings
1. OPTICAL PROPERTIES OF MICROCRYSTALLINE SILICON
Ingels, Martin ; Stutzmann, Martin ; Zollner, Stefan
Pub. info.: Materials issues in microcrystalline semiconductors : symposium held November 29-December 1, 1989, Boston, Massachusetts, U.S.A..  pp.229-234,  1990.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 164
2.

Conference Proceedings
Conference Proceedings
2. Raman Spectroscopy of Epitaxial Si/Si1-xGex Heterostructures
Liu, Ran ; Zollner, Stefan ; Liaw, Ming ; O'Meara David ; Cave, Nigel
Pub. info.: Epitaxy and applications of si-based heterostructures : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.63-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 533
3.

Conference Proceedings
Conference Proceedings
3. Raman and Spectroscopic Ellipsometry Studies of P-Doped Poly-Si
Zollner, Stefan ; Liu, Ran ; Christiansen, Jim ; Chen, Wei ; Monarch, Kathy ; Lee, Tan-Chen ; Singh, Rana ; Yater, Jane ; Paulson, Wayne M, ; Feng, Chris
Pub. info.: Amorphous and microcrystalline silicon technology - 1998 : symposium held April 14-17, 1998, San Francisco, California, U.S.A..  pp.957-,  1999.  Warrendale.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 507
4.

Conference Proceedings
Conference Proceedings
4. Ellipsometry Studies, Optical Properties, and Band Structure of Ge1-yCy, Ge-Rich Si1-x-yGexCy, and Boron-Doped Si1-xGex Alloys
Junge, Kelly E. ; Lange, Rudiger ; Dolan, Jennifer M. ; Zollner, Stefan ; Humlicek, Josef ; Dashiell, M. W. ; Hits, D. A. ; Orner, B. A. ; Kolodzey, James
Pub. info.: Epitaxy and applications of si-based heterostructures : symposium held April 13-17, 1998, San Francisco, California, U.S.A..  pp.125-,  1998.  Warrendale, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 533
5.

Conference Proceedings
Conference Proceedings
5. Materials and Physical Properties of Novel High-k and Medium-k Gate Dielectrics
Liu, Ran ; Zollner, Stefan ; Fejes, Peter ; Gregory, Rich ; Lu, Shifeng ; Reid, Kim ; Gilmer, David ; Nguyen, Bich-Yen ; Yu, Zhiyi ; Droopad, Ravi ; Curless, Jay ; Demkov, Alex ; Finder, Jeff ; Eisenbeiser, Kurt
Pub. info.: Gate stack and silicide issues in silicon processing II : symposium held April 17-19, 2001, San Francisco, California, U.S.A..  2002.  Warrendale, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 670
6.

Conference Proceedings
Conference Proceedings
6. Optical and Dielectric Properties of Eu- and Y-Polytantalate Thin Films
Vasilyev, Vladimir ; Drehman, Alvin ; Dauplaise, Helen ; Bouthillette, Lionel ; Roland, Mark ; Volinsky, Alex ; Zollner, Stefan ; Qin, Wentao
Pub. info.: Fundamentals of novel oxide/semiconductor interfaces : symposium held December 1-4, 2003, Boston, Massachusetts, U.S.A..  pp.177-182,  2004.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 786
7.

Conference Proceedings
Conference Proceedings
7. Optical and Structural Characterization of Nanocrystalline Silicon Superlattices: Toward Nanoscale Silicon Metrology
Zollner, Stefan ; Konkar, Atul ; Liu, Ran ; Yapa, Himansu ; Dryer, Patricia F. ; Neeley, Victoria A. ; Xie, Qianghua ; Grom, Galina F. ; Zhu, Qingyuan ; Krishnan, Rishikesh ; Fauchet, Philippe M. ; Tsybeskov, Leonid V.
Pub. info.: Microcrystalline and nanocrystalline semiconductors-2000 : symposium held November 27-30, 2000, Boston, Massachusetts, U.S.A..  2001.  Warrendale, PA..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 638
8.

Conference Proceedings
Conference Proceedings
8. Optical Properties of Thin-Film SrTiO3 on Si Grown by MBE
Zollner, Stefan ; Demokov, A.A. ; Liu, Ran ; Curless, J.A. ; Yu, Z. ; Ramdani, J. ; Droopad, R.
Pub. info.: Recent developments in oxide and metal epitaxy : theory and experiment.  pp.167-172,  2000.  Warrendale, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 619
9.

Conference Proceedings
Conference Proceedings
9. Spectroscopic Ellipsometry and Band Structure of Si1-yCy Alloys Grown Pseudomorphically on Si(001)
Zollner, Stefan ; Herzinger, Craig M. ; Woollam, John A. ; Iyer, Subramanian S. ; Powell, Adrian P. ; Eberl, Karl
Pub. info.: Strained layer epitaxy - materials processing and device applications : symposium held April 17-19, 1995, San Francisco, California, U.S.A..  pp.205-,  1995.  Pittsburgh, PA.  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 379