1.

Conference Proceedings
Conference Proceedings
1. Vegetation geochemical information exploration using pushbroom hyperspectral imager (PHI) data [5983-26]
Gan, F. ; Zhou, Q. ; Wang, R.
Pub. info.: Remote sensing for environmental monitoring, GIS applications, and geology V : 19-20 September 2005, Bruges, Belgium.  pp.59830R-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5983
2.

Conference Proceedings
Conference Proceedings
2. Microdegree polarimetry for glucose concentrations detection [5967-17]
Wang, H. ; Wei, Y. ; Zhou, Q. ; Liu, S. ; Chui, J.
Pub. info.: 2004 Shanghai International Conference on Laser Medicine and Surgery.  pp.59670H-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5967
3.

Conference Proceedings
Conference Proceedings
3. H2S/CO2 Corrosion Behavior of Tubular Goods under High Temperature and High Pressure
Zhou, Q. ; Ma, Q. ; Yi, Y.Q. ; Liu, J.J. ; Xu, H.L.
Pub. info.: Eco-materials processing & design VII : proceedings of the Conference of the 7th International Symposium on Eco-materials Processing & Design, January 8-11 2006, Chengdu, China.  pp.370-373,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 510-511
4.

Conference Proceedings
Conference Proceedings
4. A texture-based approach for extracting residential areas from high-resolution imagery [6419-53]
Gu, J. ; Chen, J. ; Zhang, H. ; Zhou, Q.
Pub. info.: Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China.  pp.64191H-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6419
5.

Conference Proceedings
Conference Proceedings
5. Study of hierarchical decentralized vibration control of structures [6174-21]
Zhou, Q. ; Duan, Z.
Pub. info.: Smart Structures and Materials 2006: Sensors and Smart Structures Technologies for Civil, Mechanical, and Aerospace Systems.  pp.61740N-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6174
6.

Conference Proceedings
Conference Proceedings
6. Robust Kalman filtering for relative state estimation of spacecraft-formation maintenance [5985-162]
Dong, Z. ; Zhou, Q.
Pub. info.: International Conference on Space Information Technology.  pp.59854K-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5985
7.

Conference Proceedings
Conference Proceedings
7. Microassembly station with controlled environment
Zhou, Q. ; Aurelian, A. ; del Corral, C. ; Esteban, P.J. ; Kallio, P. ; Chang, B. ; Koivo, H.N.
Pub. info.: Microrobotics and microassembly III : 29-30 October 2001 Newton.  pp.252-260,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4568
8.

Conference Proceedings
Conference Proceedings
8. A novel method for screening OCD using low-frequency noise measurement and parameters fitting
Zhou, Q. ; Wang, S. ; Qian, Z. ; Liu, P. ; Kong, Y.
Pub. info.: Semiconductor and Organic Optoelectronic Materials and Devices.  pp.617-623,  2000.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5624
9.

Conference Proceedings
Conference Proceedings
9. MICROROUGHNESS ANALYSIS OF SILICON WAFERS USING ULTRAVIOLET RAMAN MICROSCOPY
Wang, J. ; Tu, H. ; Liu, B. ; Zhou, Q. ; Zhu, W.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.906-911,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2
10.

Conference Proceedings
Conference Proceedings
10. MICROROUGHNESS ANALYSIS OF SILICON WAFERS USING ULTRAVIOLET RAMAN MICROSCOPY
Wang, J. ; Tu, H. ; Liu, B. ; Zhou, Q. ; Zhu, W.
Pub. info.: Semiconductor silicon 2002 : proceedings of the ninth International Symposium on Silicon Materials Science and Technology.  pp.906-911,  2002.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-2