1.

Conference Proceedings
Conference Proceedings
1. Phase-shifting AFM moire method
Asundi,A.K. ; Xie,H. ; Yu,J. ; Zhong,Z.
Pub. info.: Optical diagnostics for fluids, solids, and combustion : July 31-2 August 2001 San Diego, USA.  pp.102-110,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4448
2.

Conference Proceedings
Conference Proceedings
2. Control of sonic fatigue for high-speed flight vehicles using shape memory alloys
Mei,C. ; Zhong,Z. ; Turner,T.L.
Pub. info.: Smart structures and materials 1998 : industrial and commercial applications of smart structures technologies : 3-5 March 1998, San Diego, California.  pp.498-508,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3326
3.

Conference Proceedings
Conference Proceedings
3. CT with monochromatic synchrotron x rays and its potential in clinical research
Dilmanian,F.A. ; Wu,X.Y. ; Ren,B. ; Button,T.M. ; Chapman,L.D. ; Dobbs,J.M. ; Huang,X. ; Nickoloff,E.L. ; Parsons,E.C.,Jr. ; Petersen,M.J. ; Thomlinson,W.C. ; Zhong,Z.
Pub. info.: Developments in x-ray tomography : 28-29 July 1997, San Diego, California.  pp.25-32,  1997.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3149
4.

Conference Proceedings
Conference Proceedings
4. Thermal deformation measurement of electronic packaging component using AFM scanning moire method
Hie,H. ; Chai,G.B. ; Asundi,A.K. ; Jin,Y. ; Lu,Y. ; Ngoi,B.K.A. ; Zhong,Z.
Pub. info.: Second International Conference on Experimental Mechanics : 29 November-1 December 2000, Singapore.  pp.180-185,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4317
5.

Conference Proceedings
Conference Proceedings
5. AFM scanning moire method for nanodeformation measurement
Xie,H. ; Chai,G.B. ; Asundi,A.K. ; Yu,J. ; Lu,Y. ; Ngoi,B.K.A. ; Zhong,Z. ; Kishimoto,S.
Pub. info.: Laser interferometry X : techniques and analysis : 31 July-1 August 2000, Sandiego, USA.  Part A  pp.140-148,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4101
6.

Conference Proceedings
Conference Proceedings
6. Finite element analysis and experiments of ultrafine-pitch wire bonding
Zhong,Z. ; Goh,K.S.
Pub. info.: Microelectronic Yield, Reliability, and Advanced Packaging.  pp.28-35,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4229
7.

Conference Proceedings
Conference Proceedings
7. Tailoring the x-ray beam energy spectrum to enhance image quality of new radiography contrast agents based on Gd or other lanthanides
Dilmanian,F.A. ; Weinmann,H.-J. ; Zhong,Z. ; Bacarian,T. ; Rigon,L. ; Button,T.M. ; Ren,B. ; Wu,X.-Y. ; Zhong,N. ; Atkins,H.L.
Pub. info.: Medical Imaging 2001: Physics of Medical Imaging.  pp.417-426,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4320
8.

Conference Proceedings
Conference Proceedings
8. Measurement of thermal deformation of IC packages using the AFM scanning moire technique
Zhong,Z. ; Lu,Y. ; Xie,H. ; Ngoi,B.K.A. ; Yu,J. ; Chai,J.B. ; Asundi,A.
Pub. info.: Microelectronic Yield, Reliability, and Advanced Packaging.  pp.133-141,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4229