1.

Conference Proceedings
Conference Proceedings
1. In Situ Phosphorus Doping of Si and Si1-xGex Epitaxial Layers by RTP/VLP-CVD
Huang,X.-D. ; Han,P. ; Shi,Y. ; Zheng,Y.-D. ; Hu,L.-Q. ; Wang,R.-H. ; Zhu,S.-M.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.349-352,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
2.

Conference Proceedings
Conference Proceedings
2. Profiling the Deep Levels in SiGe/Si Microstructure by Small-Pulse Deep Level Transient Spectroscopy
Zhang,R. ; Yang,K. ; Qing,G.-Y. ; Shi,Y. ; Gu,S.-L. ; Wang,R.-H. ; Hu,L.-Q. ; Gao,W.-Z. ; Zheng,Y.-D.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.485-490,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201