1.

Conference Proceedings

Conference Proceedings
Shang,L. ; Zheng,D. ; Zheng,X.
Pub. info.: Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China.  pp.167-170,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4221
2.

Conference Proceedings

Conference Proceedings
Koller,Wolfram ; Avila-Adame,C. ; Olaya,G. ; Zheng,D.
Pub. info.: Agrochemical resistance : extent, mechanism, and detection.  pp.215-229,  2001.  Washington, DC.  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 808
3.

Conference Proceedings

Conference Proceedings
Sun,S. ; Chen,P. ; Zheng,D. ; Okasaki,T. ; Hayami,M.
Pub. info.: Optical storage technology : 16-18 September, 1998, Beijing, China.  pp.11-16,  1998.  Bellingham, Washington.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3562
4.

Conference Proceedings

Conference Proceedings
Li,J. ; Chen,P. ; Zheng,D. ; Okazaki,T. ; Hayami,M.
Pub. info.: Fourth International Symposium on Optical Storage (ISOS '96).  pp.62-66,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2931
5.

Conference Proceedings

Conference Proceedings
Li,S. ; Zheng,D. ; Zhang,G. ; Zhang,Z.
Pub. info.: International Conference on Sensors and Control Techniques (ICSC 2000).  pp.165-170,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4077
6.

Conference Proceedings

Conference Proceedings
Zheng,D. ; Shang,L. ; Shi,J.
Pub. info.: Process Control and Inspection for Industry.  pp.161-165,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4222