1.

Conference Proceedings
Conference Proceedings
1. Evaluating optical and supersmooth surface using AFM in optical maunfacturing technology
Li,J. ; Xiao,S. ; Li,X. ; Ying,A. ; Zhao,A.
Pub. info.: Optical metrology roadmap for the semiconductor, optical, and data storage industries , 30-31 July 2000, San Diego, USA.  pp.59-64,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4099
2.

Conference Proceedings
Conference Proceedings
2. Evaluation of an optical surface using nanometrology in optical manufacturing technology
Li,J. ; Zhao,A. ; Li,X. ; Zhang,X. ; Wang,M.
Pub. info.: Advanced optical manufacturing and testing technology : 1-3 November 2000, Chengdu, China.  pp.566-568,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4231
3.

Conference Proceedings
Conference Proceedings
3. Evaluation of optical supersmooth surface using AFM and comparison to interference method
Li,J. ; Li,D. ; Zhang,X. ; Li,X. ; Zhao,A.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.336-344,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
4.

Conference Proceedings
Conference Proceedings
4. Testing method on nanometer-grade true microprofile of optical surface (Invited Paper)
Li,J. ; Li,X. ; Ying,A. ; Xiao,S. ; Wang,M. ; Zhao,A.
Pub. info.: Current developments in optical elements and manufacturing : 16-18 September 1998, Beijing, China.  pp.276-281,  1998.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3557
5.

Conference Proceedings
Conference Proceedings
5. Laser processing device and technology used in instrument and meter industry
Zhang,G. ; Cui,M. ; Zhao,X. ; Zhao,A. ; Wang,S.
Pub. info.: Laser Processing of Materials and Industrial Applications.  pp.371-374,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2888
6.

Conference Proceedings
Conference Proceedings
6. Inspecting the microprofile and defects of optical surfaces using an atomic-force microscope
Li,J. ; Xiao,S. ; Zhao,A. ; Li,D.
Pub. info.: Input/Output and Imaging Technologies.  pp.270-273,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3422