Image compression and encryption technologies : 22-24 October 2001, Wuhan, China. pp.107-114, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Flatness, roughness, and discrete defects characterization for computer disks, wafers, and flat panel displays II : 29-30 January 1998, San Jose, California. pp.152-162, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Surface characterization for computer disks, wafers, and flat panel displays : 28 January 1999, San Jose, California. pp.2-17, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Object detection, classification, and tracking technologies : 22-24 October 2001, Wuhan, China. pp.221-226, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Optical and infrared thin films : 1 August 2000, San Diego, USA. pp.58-64, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Algorithms for synthetic aperture radar imagery VII : 24-28 April 2000, Orlando, USA. pp.164-175, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Superplasticity in advanced materials : ICSAM-94 : proceedings of the 1994 International Conference on Superplasticity in Advanced Materials (ICSAM-94), held at the Russian Academy of Administration in Moscow on May 24-26, 1994. pp.583-588, 1994. Aedermannsdorf, Switzerland. Trans Tech Publications
Proceedings of the 16th International Modal Analysis Conference February 2-5, 1998 Fess Parker's Doubletree Resort Santa Barbara, California. Part2 pp.1598-1601, 1998. Bethel, CT. Society for Experimental Mechanics
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Proceedings of optical tomography and spectroscopy of tissue : theory, instrumentation, model, and human studies II : 9-12 February 1997, San Jose, California. pp.36-47, 1997. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering