1.

Conference Proceedings

Conference Proceedings
Biggar,S.F. ; Thome,K.J. ; Spyak,P.R. ; Zalewski,E.F.
Pub. info.: Sensors, systems, and next-generation satellites III : 20-23 September 1999, Florence, Italy.  pp.228-233,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3870
2.

Conference Proceedings

Conference Proceedings
Clodius,W.B. ; Bender,S.C. ; Kay,R.R. ; Smith,B.W. ; Atkins,W.H. ; Christensen,R.W. ; Little,C.K. ; Zalewski,E.F. ; Rappoport,W.M.
Pub. info.: Imaging spectrometry V : 19-21 July 1999, Denver, Colorado.  pp.380-391,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3753
3.

Conference Proceedings

Conference Proceedings
Butler,J.J. ; Johnson,B.C. ; Brown,S.W. ; Yoon,H.W. ; Barnes,R.A. ; Markham,B.L. ; Biggar,S.F. ; Zalewski,E.F. ; Spyak,P.R. ; Cooper,J.W. ; Sakuma,F.
Pub. info.: Sensors, systems, and next-generation satellites III : 20-23 September 1999, Florence, Italy.  pp.180-192,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3870
4.

Conference Proceedings

Conference Proceedings
Ding,X. ; Zalewski,E.F. ; Biggar,S.F.
Pub. info.: Earth observing systems V : 2-4 August 2000, San Diego, USA.  pp.88-95,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4135
5.

Conference Proceedings

Conference Proceedings
Thome,K.J. ; Whittington,E.E. ; Smith,N. ; Nandy,P. ; Zalewski,E.F.
Pub. info.: Earth observing systems V : 2-4 August 2000, San Diego, USA.  pp.51-59,  2000.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4135