Infrared Detectors and Focal Plane Arrays VII : 2-3 April 2002, Orlando, USA. pp.75-82, 2002. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Designing, processing and properties of advanced engineering materials : proceedings of the 3rd International Symposium on Designing, Processing and Properties of Advanced Engineering Materials, held in Jeju, Korea, November 5-8, 2003. pp.1033-1036, 2004. Zuerich. Trans Tech Publications