1.

Conference Proceedings
Conference Proceedings
1. Residual Stress and Lattice Distortion Mapping of Patterned Devices Which Failed Electromigration Testing Using the Microbeam X-Ray Diffraction (MXRD) Technique
York, B. R. ; Pfizenmayer, H. L. ; Lee, C. H. ; Carnes, R. O.
Pub. info.: Materials reliability in microelectronics VI : symposium held April 8-12, 1996, San Francisco, California, U.S.A..  pp.557-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 428
2.

Conference Proceedings
Conference Proceedings
2. Effect of Poly-Si on Electromigration Behaviors and Microstructure Characteristics of Au Metallization
Lee, T. ; York, B. R. ; Lindgren, B. ; Kentzinger, H. ; Lee, J. ; Christenson, C. ; Varker, C. ; Evans, K.
Pub. info.: Materials reliability in microelectronics VIII : symposium held April 13-16, 1998, San Francisco, California, U.S.A..  pp.299-,  1998.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 516
3.

Conference Proceedings
Conference Proceedings
3. Effects of Cu and Si Dopants on Electromigration Mass Transport in Al Interconnects for VLSI
Lee, C. H. ; Fejes, P. L. ; York, B. R. ; Elwell, S. A. ; Carnes, R. O. ; Lee, J. Y. ; Grivna, G. M. ; Bauguess, S. W. ; Dreyer, M. L. ; Edwards, S. R.
Pub. info.: Polycrystalline thin films II : structure, properties, and applications : symposium held November 27-December 1, 1995, Boston, Massachusetts, U.S.A..  pp.507-,  1996.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 403
4.

Conference Proceedings
Conference Proceedings
4. Effect of Annealing and Passivation on the Electromigration and Linewidth Dependence
Carnes, R. O. ; Lee, C. H. ; Keating, P. T. ; Barrall, E. M., II. ; York, B. R. ; Grivna, G. M. ; Bauguess, S. W. ; Dreyer, M. L. ; Edwards, S. R.
Pub. info.: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.435-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 391