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12 results

Conference Proceedings

1. Detector performance crystallinity and impurity study of cadmium zinc telluride crystals grown from the melt

Hermon,H. ; Schieber,M.M. ; Factor,M. ; Schlesinger,T.E. ; James,R.B. ; Yoon,H. ; Goorsky,M.S.

Pub. info.:	Hard X-ray and gamma-ray detector physics III : 30 July-1 August, 2001, San Diego, USA. pp.186-202, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4507

Conference Proceedings

2. Defect depth profiling of CdZnTe using high-energy diffraction measurements

Goorsky,M.S. ; Yoon,H. ; Ohler,M. ; Liss,K.

Pub. info.:	Hard X-ray, gamma-ray, and neutron detector physics : 19-23 July 1999, Denver, Colorado. pp.108-114, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3768

Conference Proceedings

3. Simulation study and fabrication of high-transmittance attenuated phase-shifting mask

Kim,E. ; Hong,S. ; Moon,S. ; Kim,Y. ; Yoon,H. ; No,K.

Pub. info.:	19th Annual Symposium on Photomask Technology : 15-17 September 1999, Monterey, California. Part2 pp.928-936, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3873

Conference Proceedings

4. Optimal rejection of the image extinction in confocal scanning microscopy

Seo,J. ; Park,S. ; Hee,L.J. ; Yoon,H. ; Gweon,D.

Pub. info.:	Optomechatronic systems : 5-6 November 2000, Boston, USA. pp.62-70, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4190

Conference Proceedings

5. Design and fabrication of near-field microscope using solid immersion lens

Yoon,H. ; Park,S. ; Lee,J. ; Seo,J. ; Gweon,D.

Pub. info.:	Optomechatronic systems : 5-6 November 2000, Boston, USA. pp.133-140, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4190

Conference Proceedings

6. Analysis of Cd1-xZnxTe microstructure (Invited Paper)

Heffelfinger,J.R. ; Medlin,D.L. ; Yoon,H. ; Hermon,H. ; James,R. B.

Pub. info.:	Hard X-ray and gamma-ray detector physics, optics, and applications : 31 July-1 August 1997, San Diego, California. pp.40-50, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3115

Conference Proceedings

7. Application of MEMS in microwave and millimeter-wave systems

Varadan,V.K. ; Vinoy,K.J. ; Yoon,H. ; Jose,K.A. ; Varadan,V.V.

Pub. info.:	Smart electronics and MEMS II : 13-15 December 2000, Melbourne, Australia. pp.179-187, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4236

Conference Proceedings

8. Performance improvement of rf MEMS capacitive switches with high-dielectric-constant materials

Yoon,H. ; Sha,Y. ; Sharma,P.K. ; Vinoy,K.J. ; Varadan,V.K. ; Varadan,V.V.

Pub. info.:	Smart structures and materials 2001 : smart electronics and MEMS : 5-7 March, 2001, Newport Beach, USA. pp.38-45, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4334

Conference Proceedings

9. Semiconductor material requirements for orthogonal strip detectors (Invited Paper)

Lund,J.C. ; Yoon,H. ; Hilton,N. R. ; Brunett,B. A. ; James,R. B.

Pub. info.:	Hard X-ray and gamma-ray detector physics, optics, and applications : 31 July-1 August 1997, San Diego, California. pp.190-198, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3115

10.

Conference Proceedings

10. Evaluation of Russian-grown Cd0.8Zn0.2Te

Schieber,M.M. ; Hermon,H. ; James,R. B. ; Lund,J. C. ; Antolak,A. J. ; Morse,D. H. ; Kolesnikov,N. N. ; Ivanov,Yu. N. ; Goorsky,M. S. ; Yoon,H. ; Toney,J. E. ; Schlesinger,T. E.

Pub. info.:	Hard X-ray and gamma-ray detector physics, optics, and applications : 31 July-1 August 1997, San Diego, California. pp.305-310, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3115

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