Takeda, T. ; Wu, J. ; Lwin, T.-T. ; Yoneyama, A. ; Hirai, Y. ; Hyodo, K. ; Sunaguchi, N. ; Yuasa, T. ; Minami, M. ; Kose, K. ; Akatsuka, T.
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Developments in X-ray tomography V : 15-17 August 2006, San Diego, California, USA. pp.63180W-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Applications of digital image processing XXVI : 5-8 August 2003, San Diego, California, USA. pp.21-32, 2003. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Takeda, T. ; Wu, J. ; Yoneyama, A. ; Tsuchiya, Y. ; Lwin, T.-T. ; Hirai, Y. ; Kuroe, T. ; Yuasa, T. ; Hyodo, K. ; Dilmanian, F.A. ; Akatsuka, T.
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Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA. pp.380-391, 2004. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering