1.

Conference Proceedings

Conference Proceedings
Tamiya,E. ; Iwabuchi,S. ; Hashigasako,A. ; Murakami,Y. ; Sakaguchi,T. ; Morita,Y. ; Yokoyama,K.
Pub. info.: Proceedings of scanning and force microscopies for biomedical applications : 24-25 January 1999, San Jose, California.  pp.42-51,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3607
2.

Conference Proceedings

Conference Proceedings
Iwabuchi,S. ; Hashigasako,A. ; Morita,Y. ; Sakaguchi,T. ; Murakami,Y. ; Yokoyama,K. ; Tamiya,E.
Pub. info.: Proceedings of scanning and force microscopies for biomedical applications : 24-25 January 1999, San Jose, California.  pp.102-107,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3607
3.

Conference Proceedings

Conference Proceedings
Degenaar,P. ; Murakami,Y. ; Yokoyama,K. ; Tamiya,E. ; Pioufle,B.Le ; Fujita,Y.
Pub. info.: Scanning and force microscopies for biomedical applications : 23-24 January 2000, San Jose, California.  pp.189-198,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3922
4.

Conference Proceedings

Conference Proceedings
Yamashita,K. ; Kunieda,H. ; Tawara,Y. ; Tamura,K. ; Ogasaka,Y. ; Haga,K. ; Okajima,T. ; Hidaka,Y. ; Ichimaru,S. ; Takahashi,S. ; Goto,A. ; Kito,H. ; Tsusaka,Y. ; Yokoyama,K.
Pub. info.: X-ray optics, instruments, and missions II : 18-20 July 1999, Denver, Colorado.  pp.327-335,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3766
5.

Conference Proceedings

Conference Proceedings
Kuriyama,K. ; Sakai,K. ; Kato,T. ; Iijima,T. ; Okada,M. ; Yokoyama,K.
Pub. info.: Proceedings of the 18th International Conference on Defects in Semiconductors : ICDS-18, Sendai, Japan, July 23-28, 1995.  pp.1443-1448,  1995.  Zurich, Switzerland.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 196-201
6.

Conference Proceedings

Conference Proceedings
Tamiya,E. ; Iwabuchi,S. ; Murakami,Y. ; Sakaguchi,T. ; Yokoyama,K. ; Chiba,N. ; Muramatsu,H.
Pub. info.: Chemical, biochemical, and environmental fiber sensors VIII : 6-7 August 1996, Denver, Colorado.  pp.12-15,  1996.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 2836
7.

Technical Paper

Technical Paper
Carruthers,D. ; Sakamoto,T. ; Bratton,R. ; Rhodes,B. ; Yokoyama,K. ; Masaki,H. ; Bath,D. ; Jackson,B.
Pub. info.: Proceedings of the annual automotive technology development contractors' coordination meeting 1994, Dearborn, Michigan, October 24-27, 1994.  pp.351-356,  1995.  Warrendale, Pa..  Society of Automotive Engineering, Inc.
Title of ser.: SAE publication
Ser. no.: P-289
8.

Conference Proceedings

Conference Proceedings
Murakami,Y. ; Yokoyama,K. ; Tamiya,E.
Pub. info.: Micro- and Nanofabricated Structures and Devices for Biomedical Environmental Applications.  pp.11-14,  1998.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3258
9.

Conference Proceedings

Conference Proceedings
Yokoyama,A. ; takayanagi,T. ; Yokoyama,K.
Pub. info.: High-Power Lasers in Energy Engineering.  pp.223-230,  2000.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3886