1.

Conference Proceedings
Conference Proceedings
1. Hot-Carrier Effect in Submicron pMOSFETs
Saha, S. ; Yeh, C. S. ; Lindorfer, Ph. ; Luo, J. ; Nellore, U. ; Gadepally, B.
Pub. info.: Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A..  pp.21-,  1995.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 391
2.

Conference Proceedings
Conference Proceedings
2. Cluster-Ion Photodissociation and Spectroscopy in a Reflectron Time-of-Flight Mass Spectrometer
Willey, K. F. ; Robbins, D. L. ; Yeh, C. S. ; Duncan, M. A.
Pub. info.: Time-of-flight mass spectrometry.  pp.61-,  1994.  Washington, DC.  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 549