1.

Conference Proceedings
Conference Proceedings
1. Low Resistivity Contact Materials for ULSI Applications and Metal/Seniiconductor Interfaces*
Zaima, S. ; Yasuda, Y.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.447-462,  2001.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2001-2
2.

Conference Proceedings
Conference Proceedings
2. Atomistic Characterization of Radical Nitridation Process on Si(100) Surfaces
Yasuda, Y. ; Sakai, A. ; Zaima, S.
Pub. info.: Silicon nitride and silicon dioxide thin insulating films VII : proceedings of the international symposium.  pp.495-506,  2003.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-2
3.

Conference Proceedings
Conference Proceedings
3. Low Power and High Speed Hf-based Gated CMOS FET with Dual Poly-Si Gate Electrodes (Invited paper)
Iwamoto, T. ; Ogura, T. ; Terai, M. ; Morioka, A. ; Saitoh, M. ; Kimizuka, N. ; Yasuda, Y. ; Imai, K. ; Fujieda, S. ; Watanabe, H.
Pub. info.: ULSI Process Integration : proceedings of the International Symposium.  pp.143-154,  2005.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2005-06
4.

Conference Proceedings
Conference Proceedings
4. Optical terminal for NeLS in-orbit demonstration
Koyama, Y. ; Morikawa, E. ; Shiratama, K. ; Suzuki, R. ; Yasuda, Y.
Pub. info.: Free-space laser communication technologies XVI : 27, 29 January 2004, San Jose, California, USA.  pp.29-36,  2004.  Bellingham, Wash., USA.  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5338
5.

Conference Proceedings
Conference Proceedings
5. Frequency Response Method for Investigation of Various Dynamic Phenomena Occurring Simultaneously in a Gas/Zeolite System
Yasuda, Y.
Pub. info.: Zeolites and related microporous materials : state of the art 1994 : proceedings of the 10th International Zeolite Conference, Garmisch-Partenkirchen, Germany, July 17-22, 1994.  B  pp.1331-,  1994.  Amsterdam.  Elsevier
Title of ser.: Studies in surface science and catalysis
Ser. no.: 84
6.

Conference Proceedings
Conference Proceedings
6. Components development for NeLS optical terminal
Koyama, Y. ; Morikawa, E. ; Kunimori, H. ; Shiratama, K. ; Yasuda, Y.
Pub. info.: Free-space laser communication technologies XVII : 25-26 January 2005, San Jose, California, USA.  pp.217-224,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5712
7.

Conference Proceedings
Conference Proceedings
7. Texture-control of lead zirconate titanate films for actuator applications (Invited Paper)
Iijima, T. ; Ito, S. ; Matsuda, H. ; Tani, M. ; Akamatsu, M. ; Yasuda, Y.
Pub. info.: Transducing materials and devices : 30 October-1 November 2002, Brugge, Belgium.  pp.98-110,  2003.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4946
8.

Conference Proceedings
Conference Proceedings
8. (8.1) 4:05 - 4:35 PM - Group-IV Semiconductor Materials Engineering for Advanced Device Technology (Invited)
Yasuda, Y. ; Sakai, A. ; Nakatsuka, O. ; Zaima, S. (Nagoya University)
Pub. info.: SiGe: materials, processing, and devices : proceedings of the First international symposium.  pp.555-568,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-07
9.

Conference Proceedings
Conference Proceedings
9. Orientation Dependences of the Initial Oxidation of H-terminated Si Surfaces Studied by High-Resolution Electron Energy-Loss Spectroscopy
Ikeda, H. ; Furuta, S. ; Zaima, S. ; Yasuda, Y.
Pub. info.: The physics and chemistry of SiO[2] and the Si-SiO[2] interface-3, 1996 : proceedings of the Third International Symposium on the Physics and Chemistry of SiO[2] and the Si-SiO[2] Interface.  pp.72-80,  1996.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 96-1
10.

Conference Proceedings
Conference Proceedings
10. The Origin and the Creation Mechanism of Positive Charges in Silicon Oxide Films
Ohmori, K. ; Ikeda, H. ; Sakai, A. ; Zaima, S. ; Yasuda, Y.
Pub. info.: The physics and chemistry of SiO2 and the Si-SiO2 interface-4, 2000 : proceedings of the fourth International Symposium on the Physics and Chemistry of SiO2 and the Si-SiO2 Interface, Tronto, Canada, May 15-18, 2000.  pp.345-352,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-2