Fabrication, testing, and reliability of semiconductor lasers III : 29-30 January, 1998, San Jose, California. pp.51-58, 1998. Bellingham, Washington. SPIE-The International Society for Optical Engineering
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Instruments for optics and optoelectronic inspection and control, 8-10 November 2000, Beijing, China. pp.61-64, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Photorefractive fiber and crystal devices : materials, optical properties, and applications V : 18-19 July 1999, Denver, Colorado. pp.134-140, 1999. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering
Optical measurement and nondestructive testing : Techniques and applications, 8-10 November 2000, Beijing, China. pp.32-36, 2000. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
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Proceedings of SPIE - the International Society for Optical Engineering