1.

Conference Proceedings
Conference Proceedings
1. A Web-Based Embedded Sequential Controller with USB 1-N Wireless I/O Modules
Sheu, Y.H. ; Li, W.J. ; Chen, Y.C. ; Yang, J.Y.
Pub. info.: Progress on advanced manufacture for micro/nano technology 2005 : proceedings of the 2005 International Conference on Advanced Manufacture Taipei, Taiwan, R.O.C. November 28th-December 2nd, 2005.  pp.535-540,  2006.  Uetikon-Zuerich.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 505-507
2.

Conference Proceedings
Conference Proceedings
2. Analysis of the Leakage Current of Poly-Si TFT Using Counter-Doping Process
Yang, J.Y. ; Yu, S.H. ; Kim, J.H.
Pub. info.: Thin Film Transistor Technologies V : proceedings of the International Symposium.  pp.205-213,  2000.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2000-31
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Conference Proceedings
Conference Proceedings
3. Development of Poly-Si CMOS TFT Using Counter Doping Process
Yang, J.Y. ; Yu, S.H. ; Kim, J.I. ; Yang, M.S.
Pub. info.: Thin Film Transistor Technologies VI : proceedings of the international symposium.  pp.47-54,  2002.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2002-23
4.

Conference Proceedings
Conference Proceedings
4. Appliation of wide-angle photoelectric sensor in the laser-atmosphere communication system
Song, L. ; Yang, J.Y. ; Wang, Y. ; Zhao, H.L.
Pub. info.: Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China.  pp.449-451,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4919
5.

Conference Proceedings
Conference Proceedings
5. Multisensor data fusion in laser target identification system
Wang, X.M. ; Yang, J.Y. ; Liu, Z. ; Wang, Y. ; Jia, Y.
Pub. info.: Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China.  pp.466-469,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4919
6.

Conference Proceedings
Conference Proceedings
6. CMOS APS digital camera based on enhanced parallel port
Liu, Z. ; Yang, J.Y. ; Wang, Y.F. ; Hao, Z.H.
Pub. info.: Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China.  pp.436-440,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4919
7.

Conference Proceedings
Conference Proceedings
7. Application of CMOS APS in star tracker
Liu, Z. ; Wang, Y.F. ; Yang, J.Y. ; Hao, Z.H.
Pub. info.: Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China.  pp.441-445,  2002.  Bellingham, Wash., USA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4919
8.

Conference Proceedings
Conference Proceedings
8. Temperature radiation measurement with optical fiber sensor
Yang, J.Y. ; Liu, Z.
Pub. info.: Advanced sensor systems and applications : 15-18 October 2002, SHanghai, China.  pp.555-558,  2002.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4920
9.

Conference Proceedings
Conference Proceedings
9. Application of scatterometry for CD and profile metrology in 193-nm lithography process development
Chen, L.-J. ; Ke, C.-M. ; Yu, S.S. ; Gau, T.-S. ; Chen, P. ; Ku, Y.-C. ; Lin, B.J. ; Engelhard, D. ; Hetzer, D. ; Yang, J.Y. ; Barry, K.A. ; Yap, L. ; Yang, W.
Pub. info.: Metrology, Inspection, and Process Control for Microlithography XVII.  1  pp.568-576,  2003.  Bellingham, WA.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5038