1.

Conference Proceedings

Conference Proceedings
Ramaker, D.E. ; Yang, H. ; Idzerda, Y.U.
Pub. info.: Atomic-scale imaging of surfaces and interfaces : symposium held November 30-December 2, 1992, Boston, Massachusetts, U.S.A..  pp.225-230,  1993.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 295
2.

Conference Proceedings

Conference Proceedings
Meier, J. ; Aitchison, J.S. ; Stegeman, G.I. ; Christodoulides, D.N. ; Morandotti, R. ; Yang, H. ; Salamo, G. ; Sorel, M. ; Silberberg, Y.
Pub. info.: Photonic applications in nonlinear optics, nanophotonics, and microwave photonics : 12-14 September 2005, Toronto, Canada.  pp.597103-597103,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5971
3.

Conference Proceedings

Conference Proceedings
Park, C. ; Lee, J. ; Yang, K. ; Tseng, S. ; Min, Y.-H ; Yang, H. ; Yim, D. ; Kim, J.
Pub. info.: Optical Microlithography XIX.  pp.61540F-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6154
4.

Conference Proceedings

Conference Proceedings
Yang, H. ; Shin, t. J. ; Ling, M. ; Ryu, C. Y. ; Bao, Z.
Pub. info.: Organic Field-Effect Transistors IV.  pp.59400B-,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5940
5.

Conference Proceedings

Conference Proceedings
Namavar, Fereydoon ; Pinizzotto, R.F. ; Yang, H. ; Kalkhoran, N. ; Maruska, P.
Pub. info.: Silicon-based optoelectronic materials : Symposium held April 12-14, 1993, San Francisco, California, U.S.A..  pp.343-348,  1993.  Pittsburgh, PA.  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 298
6.

Conference Proceedings

Conference Proceedings
Nicholson, D.M. ; Brown, R.H. ; Butler, W.H. ; Yang, H. ; Swihart, J.W. ; Allen, P.B. ; Mehta, A. ; Schwartz, L.M.
Pub. info.: Applications of multiple scattering theory to materials science : symposium held December 2-5, 1991, Boston, Massachusetts, U.S.A..  pp.269-276,  1992.  Pittsburgh, Pa..  Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 253
7.

Conference Proceedings

Conference Proceedings
Yu, J. ; Zhang, G. ; Li, P. ; Qin, K. ; Yang, H.
Pub. info.: Geoinformatics 2006 : Remotely sensed data and information : 28-29 October 2006, Wuhan, China.  pp.64191Q-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6419
8.

Conference Proceedings

Conference Proceedings
yan, S. ; Du, Z. ; Yang, H. ; Zhang, T. ; Wang, J.
Pub. info.: ICO20 : lasers and laser technologies : 21-26 August, 2005, Changchun, China.  pp.602811-602811,  2005.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6028
9.

Conference Proceedings

Conference Proceedings
Yu, X. ; Shao, Q. ; Zhu, Y. ; Deng, Y. ; Yang, H.
Pub. info.: Geoinformatics 2006 : Geospatial information technology : 28-29 October 2006, Wuhan, China.  pp.64210D-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6421
10.

Conference Proceedings

Conference Proceedings
Li, X. ; Yang, H. ; Wu, L. ; Song, Y.
Pub. info.: 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optical Test and Measurement Technology and Equipment.  pp.615054-,  2006.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 6150