Search records | 東京工業大学附属図書館文献データベース

You can search for articles included in proceedings of international conferences and technical papers which Tokyo Tech Library holds.
Tokyo Tech members can obtain tables of contents of 17,000 foreign journals by SwetScan. Tokyo Tech Library does not cover all of them.
List of Searchable Databases

Clear Form

Search for other sites by same keyword(s).

CiNii Books

NDL Search

WebcatPlus

amazon

カーリル

WorldCat

Filter

Title:

Author:

ISBN / ISSN / Paper No:

Source Title:

Publisher:

Publication Year:

～

Clear Form

Type:

Conference Proceedings

Technical Paper

Academic Journal

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

15 results

Conference Proceedings

1. Improvement of thickness uniformity of quartz crystal wafer by numerically controlled plasma CVM [5869-17]

Shibahara, M. ; Yamamura, K. ; Sano, Y. ; Sugiyama, T. ; Endo, K. ; Mori, Y.

Pub. info.:	Optical manufacturing and testing VI : 31 July-1 August 2005, San Diego, California, USA. pp.58690I-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5869

Conference Proceedings

2. Development of a figure correction method having spatial resolution close to 0.1 mm

Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.

Pub. info.:	Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.105-111, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5193

Conference Proceedings

3. Fabrication technology of hard x-ray aspherical mirror optics and application to nanospectroscopy

Mori, Y. ; Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Shimura, M. ; Ishizaka, Y.

Pub. info.:	Advances in mirror technology for X-ray, EUV lithography, laser, and other applications : 7-8 August 2003, San Diego, California, USA. pp.11-17, 2004. Bellingham, Wash., USA. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5193

Conference Proceedings

4. Hard x-ray nano-focusing of 40nm level using K-B mirror optics for nanoscopy/spectroscopy [5918-05]

Matsuyama, S. ; Mimura, H. ; Yumoto, H. ; Hara, H. ; Yamamura, K. ; Sano, Y. ; Endo, K. ; Mori, Y. ; Nishino, Y. ; Tamasaku, K. ; Yabashi, M. ; Tshikawa, T. ; Yamauchi, K.

Pub. info.:	Laser-generated, synchrotron, and other laboratory X-ray and EUV sources, optics, and applications II : 2-4 August 2005, San Diego, California, USA. pp.591804-591804, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5918

Conference Proceedings

5. High-spatial-resolution scanning x-ray fluorescence microscope with Kirkpatrick-Baez mirrors [6317-48]

Matsuyama, S. ; Mimura, H. ; Shimura, M. ; Yumoto, H. ; Katagishi, K. ; Handa, S. ; Shibatani, A. ; Sano, Y. ; Yamamura, K. ; Nishino, Y. ; Tamasaku, K. ; Yabashi, M. ; Ishikawa, T. ; Yamauchi, K.

Pub. info.:	Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA. pp.631719-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6317

Conference Proceedings

6. A new designed ultra-high precision profiler [5921-07]

Higashi, Y. ; Takaie, Y. ; Endo, K. ; Kume, T. ; Enami, K. ; Yamauchi, K. ; Yamamura, K. ; Sano, H. ; Ueno, K. ; Mori, Y.

Pub. info.:	Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA. pp.592107-592107, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5921

Conference Proceedings

7. Surface figuring and measurement methods with spatial resolution close to 0.1 mm for x-ray mirror frabrication [5921-24]

Mimura, H. ; Yumoto, H. ; Matsuyama, S. ; Yamamura, K. ; Sano, Y. ; Endo, K. ; Mori, Y. ; Nishino, Y. ; Tabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Yamauchi, Y.

Pub. info.:	Advances in metrology for x-ray and EUV optics : 2-3 August 2005, San Diego, California, USA. pp.59210M-, 2005. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	5921

Conference Proceedings

8. Surface gradient integrated profiler for x-ray and EUV optics: 3D mapping of 1m-long flat mirror and off-axis parabolic mirror [6317-11]

Higashi, Y. ; Takaie, Y. ; Endo, K. ; Kume, T. ; Enami, K. ; Yamauchi, K. ; Yamamura, K. ; Sano, H. ; Uchikoshi, J. ; Ueno, K. ; Mori, Y.

Pub. info.:	Advances in X-ray/EUV optics, components, and applications : 14-16 August 2006, San Diego, California, USA. pp.63170B-, 2006. Bellingham, Wash.. SPIE - The International Society of Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	6317

Conference Proceedings

9. Aspheric surface fabrication in nanometer-level accuracy by numerically controlled plasma chemical vaporization machining (CVM) and elastic emission machining (EEM)

Yamamura, K. ; Mimura, H. ; Yamauchi, K. ; Sano, Y. ; Saito, A. ; Kinoshita, T. ; Endo, K. ; Mori, Y. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T.

Pub. info.:	X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA. pp.265-270, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4782

10.

Conference Proceedings

10. Wave-optical analysis of submicron focusing of hard x-ray beams by reflective optics

Yamauchi, K. ; Yamamura, K. ; Mimura, H. ; Sano, Y. ; Saito, A. ; Kanaoka, M. ; Endo, K. ; Souvorov, A. ; Yabashi, M. ; Tamasaku, K. ; Ishikawa, T. ; Mori, Y.

Pub. info.:	X-ray mirrors, crystals, and multilayers II : 10-11 July 2002, Seattle, Washington, USA. pp.271-276, 2002. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4782

15 results

Select: Check all | Remove all

Sort order

10 | 50 | 100 / Per Page

Filtering by:

Author: Yamamura, K.