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23 results

Conference Proceedings

1. Anisotropic nanometal particles on TiO2 film using sol-gel method

Kawazu,M. ; Nara,M. ; Yamamoto,H.

Pub. info.:	Micro- and nano-optics for optical interconnection and information processing : 29-31 July 2001, San Diego, USA. pp.7-14, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4455

Conference Proceedings

2. Angle measurement by use of a liquid crystal spatial light modulator with optical feedback

Hayasaki,Y. ; Hara,S. ; Yuasa,Y. ; Yamamoto,H. ; Nishida,N.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.50-53, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4416

Conference Proceedings

3. Measurement of spatial coherence of a superluminescent diode using an interferometer with double slit

Negi,N. ; Yamamoto,H. ; Hayasaki,Y. ; Nishida,N.

Pub. info.:	Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan. pp.384-387, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4416

Conference Proceedings

4. Autonomous recognition of large-scale shapes in marine observation satellite images

Yamamoto,H. ; Homma,K. ; Gomi,H. ; Tameishi,H. ; Shingu,H.

Pub. info.:	Applications of digital image processing XXIV : 31 July - 3 August 2001, San Diego, USA. pp.537-545, 2001. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4472

Conference Proceedings

5. Nikon EB Stepper: the latest development status

Suzuki,K. ; Fujiwara,T. ; Hada,K. ; Hirayanagi,N. ; Kawata,S. ; Morita,K. ; Okamoto,K. ; Okino,T. ; Shimizu,S. ; Yahiro,T. ; Yamamoto,H.

Pub. info.:	Emerging lithographic technologies V : 27 February-1 March, 2001, Santa Clara, [California], USA. pp.80-87, 2001. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	4343

Conference Proceedings

6. Oxygen nonstoichiometry of MBE-grown cuprate films to lose or give high-Tc superconductivity

Naito,M. ; Sato,H. ; Yamamoto,H.

Pub. info.:	Superconducting and related oxides, physics and nanoengineering III : 20-24 July, 1998, San Diego, California. pp.214-225, 1998. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3481

Conference Proceedings

7. Surface treatment effects on Si(111) and (100) surface structures and Si/SiO2 interface state

Yamamoto,H. ; Okumura,K. ; Kanashima,T. ; Okuyama,M.

Pub. info.:	Third International Conference on Thin Film Physics and Applications : 15-17 April 1997, Shanghai, China. pp.161-165, 1998. Bellingham, Wash.. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3175

Conference Proceedings

8. Estimation of spatial resolution characteristics for the AVNIR sensor

Naka,M. ; Koshiishi,H. ; Yamamoto,H. ; Mukaida,A. ; Iwata,Y.

Pub. info.:	Sensors, systems, and next-generation satellites III : 20-23 September 1999, Florence, Italy. pp.344-351, 1999. Bellingham, Wash., USA. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3870

Conference Proceedings

9. Data of scattered electron characteristics in 1OO-kV EB stepper

Morita,K. ; Yahiro,T. ; Shimizu,S. ; Yamamoto,H. ; Hirayanagi,N. ; Fujiwara,T. ; Suzuki,S. ; Shimizu,H. ; Kawata,S. ; Okino,T. ; Suzuki,K.

Pub. info.:	Emerging lithographic technologies IV : 28 February-1 March 2000, Santa Clara, USA. pp.703-712, 2000. Bellingham, Wash.. SPIE - The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3997

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Conference Proceedings

10. Early results of estimation experiments of spatial resolution characteristics for the AVNIR sensor

Naka,M. ; Koshiishi,H. ; Yamamoto,H. ; Homma,K. ; Mukaida,A. ; Iwata,Y.

Pub. info.:	Sensors, systems, and next-generation satellites : 22-25 September 1997, London, UK. pp.93-100, 1997. Bellingham, Wash., USA. SPIE-The International Society for Optical Engineering
Title of ser.:	Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:	3221

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Author: Yamamoto,H.