1.

Conference Proceedings
Conference Proceedings
1. Measurements of Benard-Marangoni waves using phase-shifting digital holography
Inomoto,O. ; Yamaguchi,I.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN 2001) : 6-8 June 2001, Yokohama, Japan.  pp.124-127,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4416
2.

Conference Proceedings
Conference Proceedings
2. Fringe locking in a laser diode interferometer in the presence of current modulation
Liu,J. ; Yamaguchi,I.
Pub. info.: Testing, packaging, reliability, and applications of semiconductor lasers IV : 28 January 1999, San Jose, California.  pp.4-13,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3626
3.

Conference Proceedings
Conference Proceedings
3. Wavelength scanning confocal interference microscope for separate measurement of refractive index and geometrical thickness
Fukano,T. ; Yamaguchi,I.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.30-33,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3740
4.

Conference Proceedings
Conference Proceedings
4. Surface shape measurement using a wavelength-scanning Fizeau interferometer
Yamamoto,A. ; Yamaguchi,I. ; Yano,M.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.614-617,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3740
5.

Conference Proceedings
Conference Proceedings
5. Laser diode optical feedback interferometer for surface measurement outside optical benches
Liu,J. ; Yamaguchi,I.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.610-613,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3740
6.

Conference Proceedings
Conference Proceedings
6. Local plasmon sensor using a gold colloid monolayer
Okamoto,T. ; Kobayashi,T. ; Yamaguchi,I.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.533-536,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3740
7.

Conference Proceedings
Conference Proceedings
7. Height gauging by wavelength-scanning interferometry with phase detection
Kato,J. ; Yamaguchi,I.
Pub. info.: Optical engineering for sensing and nanotechnology (ICOSN '99) : 16-18 June 1999, Yokohama, Japan.  pp.594-597,  1999.  Bellingham, Wash..  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3740
8.

Conference Proceedings
Conference Proceedings
8. Separate measurement of geometrical thickness and refractive index by an interference confocal microscope
Fukano,T. ; Yamaguchi,I.
Pub. info.: Advanced photonic sensors and applications : 30 November-3 December 1999, Singapore.  pp.342-354,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3897
9.

Conference Proceedings
Conference Proceedings
9. Preparation of metal oxide thin films using coating photolysis process with ArF excimer laser
Tsuchiya,T. ; Watanabe,A. ; Imai,Y. ; Niino,H. ; Yabe,A. ; Yamaguchi,I. ; Manabe,T. ; Kumagai,T. ; Mizuta,S.
Pub. info.: First International Symposium on Laser Precision Microfabrication : 14-16 June 2000, Omiya, Saitama, Japan.  pp.311-314,  2000.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4088
10.

Conference Proceedings
Conference Proceedings
10. Measurement of thicknesses and refractive indices by low-coherence confocal interferometric microscopy
Yamaguchi,I. ; Fukano,T.
Pub. info.: Selected papers from International Conference on Optics and Optoelectronics '98 : Silber Jubilee Symposium of the Optical Society of India : 9-12 December 1998, Dehradun, India.  pp.371-383,  1999.  Bellingham, Wash., USA.  SPIE - The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 3729