1.

Conference Proceedings

Conference Proceedings
Veirman,A.De ; Yallup,K. ; Landuyt,J.Van ; Maes,H.E.
Pub. info.: Proceedings of the 15th International Conference on Defects in Semiconductors : Budapest, Hungary, August 22-26, 1988.  Part1  pp.207-212,  1989.  Aederlmannsdorf, Switzwelns.  Trans Tech Publications
Title of ser.: Materials science forum
Ser. no.: 38-41
2.

Conference Proceedings

Conference Proceedings
Blair,P. ; McMillan,D. ; Podlecki,J. ; Begbie,M.L. ; Yallup,K.
Pub. info.: MEMS design, fabrication, characterization, and packaging : 30 May-1 June 2001, Edinburgh, UK.  4407  pp.193-201,  2001.  Bellingham, Wash..  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 4407