1.

Conference Proceedings
Conference Proceedings
1. Leadframe technology by photofabrication
Yagi, H.
Pub. info.: Proceedings of the Second International Symposium on Electrochemical Technology Applications in Electronics.  pp.133-142,  1993.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-20
2.

Conference Proceedings
Conference Proceedings
2. HIGH TEMPERATURE HOLE BURNING OF THE NV CENTER AND THE 2.16 eV CENTER IN CVD DIAMOND
Yagi, H. ; Yokota, Y. ; Kurita, A. ; Hatta, A. ; Ito, T. ; Kushida, T. ; Hiraki, A.
Pub. info.: Proceedings of the Third International Symposium on Diamond Materials.  pp.741-745,  1993.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-17
3.

Conference Proceedings
Conference Proceedings
3. CHARACTERIZATION OF SURFACE CONDUCTIVE LAYERS OF DIAMOND FILMS
Mori, Y. ; Sivazlian, F. ; Yagi, H. ; Show, Y. ; Deguchi, M. ; Yagyu, H. ; Eimori, N. ; Okada, T. ; Hatta, A. ; Nishimura, K. ; Kitabatake, M. ; Ito, T. ; Hirao, T. ; Izumi, T. ; Sasaki, T. ; Hiraki, A.
Pub. info.: Proceedings of the Third International Symposium on Diamond Materials.  pp.706-712,  1993.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 1993-17
4.

Conference Proceedings
Conference Proceedings
4. Nitrogen Concentration Measurement of CZ Silicon
Inoue, N. ; Fujiyama, N. ; Yagi, H.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.516-526,  2003.  Pennington, NJ.  SPIE-The International Society for Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5133
5.

Conference Proceedings
Conference Proceedings
5. Standardization of Nitrogen Analysis in CZ-Si by Charged Particle Activation Analysis
Masumoto, K. ; Nozaki, T. ; Yagi, H. ; Minai, Y. ; Saito, Y. ; Futatsugawa, S. ; Inoue, N.
Pub. info.: High purity silicon VIII : proceedings of the international symposium.  pp.69-76,  2004.  Pennington, N.J..  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2004-05
6.

Conference Proceedings
Conference Proceedings
6. Role of Purified Cytochrome P-448 and Epoxide Hydrase in the Activation and Detoxification of Benzo[α]pyrene
Levin, W. ; Wood, A. W. ; Lu, A. Y. H. ; Ryan, D. ; West, S. ; Thakker, D. R. ; Yagi, H. ; Jerina, D. M. ; Conney, A. H.
Pub. info.: Drug metabolism concepts : a symposium cosponsored by the Division of Medicinal Chemistry and the division of Analytical Chemistry at the 172nd meeting of the American Chemical Society, San Francisco, Calif., August 31, 1976 : [Proceedings].  pp.99-,  1977.  Washington.  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 44
7.

Conference Proceedings
Conference Proceedings
7. In vitro Reactions of the Diastereomeric 9,10-Epoxides of (+) and (-)-trans-7,8-Dihydroxy-7,8-dihydrobenzo[α]pyrene with Polyguanylic Acid and Evidence for Formation of an Enantiomer of Each Diastereomeric 9,10-Epoxide from Benzo[α]pyrene in Mouse Skin
Moore, P. D. ; Koreeda, M. ; Wislocki, P. G. ; Levin, W. ; Conney, A. H. ; Yagi, H. ; Jerina, D. M.
Pub. info.: Drug metabolism concepts : a symposium cosponsored by the Division of Medicinal Chemistry and the division of Analytical Chemistry at the 172nd meeting of the American Chemical Society, San Francisco, Calif., August 31, 1976 : [Proceedings].  pp.127-,  1977.  Washington.  American Chemical Society
Title of ser.: ACS symposium series
Ser. no.: 44
8.

Conference Proceedings
Conference Proceedings
8. Nitrogen Concentration Measurement of CZ Silicon
Inoue, N. ; Fujiyama, N. ; Yagi, H.
Pub. info.: Analytical and diagnostic techniques for semiconductor materials, devices, and processes : joint proceedings of the symposia on: ALTECH 2003, Analytical Techniques for Semiconductor Materials and Process Characterization IV, Paris, France and the 202nd Meeting of the Electrochemical Society, Diagnostic Techniques for Semiconductor Materials and Devices VI, Salt Lake City, Utah.  pp.516-526,  2003.  Pennington, NJ.  Electrochemical Society
Title of ser.: Electrochemical Society Proceedings Series
Ser. no.: 2003-3
9.

Technical Paper
Technical Paper
9. Evaluation Method for HDV Fuel Economy Performance with PC Simulation and Mapping Procedure.
Noda, A. ; Tsukamoto, Y. ; Sato, T. ; Yagi, H.
Pub. info.: 2003 International Fuels and Lubricants Meeting : SAE technical paper.  2003.  Warrendale, Penn..  Society of Automotive Engineers
Title of ser.: Society of Automotive Engineers technical paper series
Ser. no.: 2003
10.

Conference Proceedings
Conference Proceedings
10. Measurements of nonlinear refractive indices in ceramic laser media
Senatsky, Yu. ; Shirakawa, A. ; Sato, Y. ; Hagiwara, J. ; Lu, J. ; Ueda, K. ; Yagi, H. ; Yanagitani, T.
Pub. info.: Laser Optics 2003: Solid State Lasers and Nonlinear Frequency Conversion.  pp.88-97,  2004.  Bellingham, Wash..  SPIE - The International Society of Optical Engineering
Title of ser.: Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.: 5478