1.

Conference Proceedings
Conference Proceedings
1. Gate Dielectrics for High Mobility Semiconductors
A. Dimoulas ; Y. Panayiotatos ; P. Tsipas ; S. Galata ; G. Mavrou
Pub. info.: Physics and technology of high-k gate dielectrics 6.  pp.295-306,  2008.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 16(5)
2.

Conference Proceedings
Conference Proceedings
2. Characterization of Atomic-Beam Deposited GeO₁₋xNx/HfO₂ Stacks on Ge
M. Houssa ; T. Conard ; J. Van Steenbergen ; G. Mavrou ; Y. Panayiotatos ; T. Dimaulas ; M. Meuris ; M. Caymax ; M. Heyns ; G. Nicholas
Pub. info.: Physics and technology of high-k gate dielectrics III.  pp.9-16,  2006.  Pennington, N.J..  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 1(5)
3.

Conference Proceedings
Conference Proceedings
3. Current Challenges in Ge MOS Technology
A. Dimoulas ; M. Houssa ; A. Ritenour ; J. Fompeyrine ; W. Tsai ; J. Seo ; Y. Panayiotatos ; P. Tsipas ; D. P. Brunco ; M. R. Caymax ; J. Locquet ; C. Dieker
Pub. info.: Advanced gate stack, source/drain and channel engineering for Si-based CMOS 2: new materials, processes, and equipment.  pp.371-384,  2006.  Pennington, NJ.  Electrochemical Society
Title of ser.: ECS transactions
Ser. no.: 3(2)