1.

Conference Proceedings
Conference Proceedings
1. Stress and Temperature Dependence of Misfit Dislocation Nucleation Rate in SiGe Alloys: Evidence of Homogeneous Nucleation
Labovitz, S. M. ; Xie, Y. H. ; Pope, D. P.
Pub. info.: Thin films - structure and morphology : symposium held December 2-6, 1996, Boston, Massachusetts, U.S.A..  pp.501-,  1997.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 441
2.

Conference Proceedings
Conference Proceedings
2. ELECTRONIC CHARACTERIZATION OF DISLOCATIONS IN RTCVD GERMANIUM-SILICON/SILICON GROWN BY GRADED LAYER EPITAXY
Grillot, P. N. ; Ringel, S. A. ; Watson, G. P. ; Fitzgerald, E. A. ; Xie, Y. H.
Pub. info.: Physics and applications of defects in advanced semiconductors : symposium held November 29-December 1, 1993, Boston, Massachusetts, U.S.A..  pp.159-,  1994.  Pittsburgh, Pa..  MRS - Materials Research Society
Title of ser.: Materials Research Society symposium proceedings
Ser. no.: 325